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Measuring system for hard X-ray imaging and energy spectrum analysis

A measurement system and energy spectrum analysis technology, which is applied in the direction of X-ray energy spectrum distribution measurement, can solve the problems that cannot meet the high time, space and resolution requirements at the same time, achieve good stray hard X-ray shielding function, and compact system , the effect of good water cooling function

Pending Publication Date: 2022-03-18
合肥综合性国家科学中心能源研究院
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  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to make up for the inability of the existing detector system to meet the high time, space and resolution requirements in the high hard X-ray flux environment at the same time, and to provide hard X-ray imaging and energy detectors suitable for high hard X-ray flux environments. Measurement Systems for Spectrum Analysis

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  • Measuring system for hard X-ray imaging and energy spectrum analysis
  • Measuring system for hard X-ray imaging and energy spectrum analysis
  • Measuring system for hard X-ray imaging and energy spectrum analysis

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Embodiment Construction

[0031] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0032] The measurement system for hard X-ray imaging and energy spectrum analysis described in the present invention can be applied to fields such as fusion reactors, accelerators, synchrotron radiation devices, non-destructive testing, and security inspection.

[0033] A measurement system for hard X-ray imaging and energy spectrum analysis provided by the invention, such as Figure 1-4 As shown, it includes: CdZnTe area array detector, PCB backplane with input and output signal transmission and conversion functions, shielding body, main controller, preamplifier array board, multi-channel analyzer and acquisition and control system; all A preamplifier is integrated on the preamplifier array board; the cadmium zinc telluride (CZT) area array detector is used as a hard X-ray detector;

[0034] The PCB backboard is used to transfer the output...

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Abstract

The invention discloses a measuring system for hard X-ray imaging and energy spectrum analysis. The measuring system is characterized by adopting a cadmium zinc telluride area array as a detector, a customized PCB (Printed Circuit Board) backboard with high-density signal distribution and transmission functions, a compact pre-amplifier array board card, a multichannel analyzer with an FPGA (Field Programmable Gate Array) as a core, and an acquisition and control system based on open source software QT. The device has good electromagnetic shielding and stray hard X-ray shielding functions, has a good water cooling function, is high in time resolution, spatial resolution and energy resolution, and can meet the requirements of high-flux hard X-ray measurement in a severe environment.

Description

technical field [0001] The present invention relates to the technical field of hard X-ray measurement, in particular to a measurement system for hard X-ray imaging and energy spectrum analysis, which obtains the spatial distribution and time evolution of hard X-ray intensity through hard X-ray imaging and energy spectrum analysis, At the same time, it can also obtain the energy information of hard X-rays, which can be used in scientific research, industry, security inspection and other fields. Background technique [0002] Hard X-ray measurement technology is widely used in scientific research, industry, security inspection and other fields. With the development of economy and technology, higher requirements are put forward for hard X-ray measurement technology, which requires higher spatial, time and energy resolution. [0003] Taking the tokamak as an example, hard X-ray diagnosis is an important tool for studying fast electrons on the tokamak. By measuring the hard X-ray...

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Application Information

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IPC IPC(8): G01T1/36
CPCG01T1/36
Inventor 林士耀曹宏睿胡立群钟国强
Owner 合肥综合性国家科学中心能源研究院