High-power microwave effect experimental test method and automatic test system

Abstract

The invention discloses a high-power microwave effect experiment testing method and an automatic testing system, and belongs to the technical field of microwave effect testing. According to the method, whether the to-be-detected piece is damaged or not is judged by detecting key parameters of the to-be-detected piece before and after high-power microwave injection and detecting an S21 parameter, input power Pinc, reflection power Pr of an input end face and output power Pout of the to-be-detected piece in the high-power microwave injection process in real time, and the damage degree is graded and classified; the invention further provides an automatic testing system which comprises a high-power microwave injection unit, a reflected signal testing unit, an S parameter real-time testing unit, an output signal testing unit and an upper computer. According to the invention, the high-power microwave injection experiment is simplified, the automatic test is realized, the method is suitable for single-tone, dual-tone and multi-tone injection, the experiment test efficiency is improved, and the test safety is guaranteed.

Description

technical field [0001] The invention belongs to the technical field of microwave effect testing, and in particular relates to a high-power microwave effect experimental testing method and an automatic testing system. Background technique [0002] With the rapid development of advanced microelectronics technology, a large number of semiconductor devices with high integration, low power consumption and high sensitivity are widely used in electronic systems, which makes the trend of miniaturization, integration and multi-function of modern electronic equipment more and more Significantly, at the same time, it also exacerbates the vulnerability of electronic systems in complex electromagnetic environments. Among them, high-power microwaves are one of the important factors that cause damage to semiconductor devices. Therefore, the experimental research on the electromagnetic effect of high-power microwaves has important engineering application value in digging the damage mechani...

AI Technical Summary

Problems solved by technology

However, this test method has some disadvantages: (1) It is only suitable for single-tone signal injection experiments, and cannot be applied to the case of multi-tone signal injection; when multi-tone signals are injected, for high linearity devices, multiple simple harmonics will appear on the oscilloscope Wave superposition phenomenon, the parameters of multi-tone signals are difficult to extract because of the superposition of time-domain waveforms, and it is even more difficult to analyze the signal changes during the high-power injection process; for strong nonlinear devices, there will be many intermodulation components, in the oscilloscope It is more difficult to observe, especially when the device under test is damaged, the nonlinearity of the device increases sharply, and it is difficult to observe and judge with an oscilloscope

(2) The amount of test data in the injection experiment is huge, and there is no grading and classification for the evaluation of the damage effect of the test piece

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