Refrigeration device and method for testing photoelectric performance of scientific-grade CCD detector

A technology for refrigeration devices and detectors, which is applied in household refrigeration devices, optical instrument testing, measuring devices, etc., can solve the problems of uncontrollable detector working temperature, increase of CCD image noise, shortening of retention time, etc., so as to facilitate popularization, Effect of reducing stress contact and stabilizing performance

Active Publication Date: 2022-04-19
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, there is no relevant refrigeration device in China for the precise temperature control of scientific grade CCD detectors for photoelectric performance testing. Only when some manufacturers calibrate the performance of CCD devices, the detectors are refrigerated. Performance calibration of CCD devices in ℃ environment
In practical applications, the photoelectric properties of CCD devices are generally tested at room temperature, and the operating temperature of the detector cannot be controlled during the entire test process.
[0003] The cooling technologies currently used in CCD cameras include classic Dewar refrigeration and semiconductor refrigeration. Semiconductor refrigeration mainly uses thermoelectric coolers that work according to the Peltier effect. Its advantages are no moving parts, simple structure, no noise, and light weight. However, it is required to package a semiconductor cooler inside the CCD device, otherwise this cooling method cannot be used
The classic Dewar bottle refrigeration uses liquid nitrogen for refrigeration, and uses a light-transmitting window to seal the vacuum chamber, which can cool the CCD device to -120°C~-20°C, but the Dewar bottle vacuum chamber deteriorates with time, and the vacuum environment The holding time is getting shorter and shorter, and the vacuum must be re-evacuated in time, and only the CCD chip can be placed inside the Dewar bottle, and the driving imaging circuit is connected to the CCD chip through a cable, which increases the noise of the CCD image

Method used

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  • Refrigeration device and method for testing photoelectric performance of scientific-grade CCD detector
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  • Refrigeration device and method for testing photoelectric performance of scientific-grade CCD detector

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Embodiment Construction

[0032] Below in conjunction with accompanying drawing, the present invention will be further described by examples.

[0033] In this example, if figure 1 As shown, a refrigeration device for testing the photoelectric performance of a scientific-grade CCD detector is applied in a CCD detector photoelectric parameter test system. The CCD detector photoelectric parameter test system includes: an integrating sphere 18, an optical filter 19, an image Acquisition device 16, tested CCD detector 13, six-degree-of-freedom adjustment mechanism 21 and industrial computer 22; optical filter 19 is placed at the spherical port of integrating sphere 18 for filtering light of integrating sphere light source; measured CCD detects The device 13 is arranged on the image acquisition device 16, and is used to convert the optical signal of the integrating sphere into an electrical signal; the image acquisition device 16 adjusts its six orientations through a six-degree-of-freedom adjustment mechani...

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Abstract

The invention discloses a refrigerating device and method for testing the photoelectric performance of a scientific-grade CCD detector, the refrigerating device comprises a heat transfer assembly, a refrigerating assembly and an automatic heating assembly, the heat transfer assembly is composed of a heat conduction copper bar, a heat conduction copper plate and a detector thermistor; the refrigeration assembly is composed of a low-temperature circulator, a fixing plate, diagonal screws, a heat insulation layer, a water inlet and outlet pipe and an aluminum block heat exchanger. The automatic heating assembly is composed of a film electric heater, an electric heating piece controller and a copper plate thermistor. The heat-conducting copper bar is connected with the heat-conducting copper plate through a flexible copper strip; heat-conducting silicone grease is coated between the aluminum block heat exchanger and the heat-conducting copper plate for heat-conducting installation; the aluminum block heat exchanger is connected with the low-temperature circulator through a water inlet-outlet pipe. Precise temperature control of the detector in the photoelectric performance test process of a scientific-grade CCD device can be achieved, it is guaranteed that the detector works in a low and stable temperature environment, and therefore the thermal noise and dark current of the detector are reduced.

Description

technical field [0001] The invention relates to a refrigeration device and a refrigeration method for testing the photoelectric performance of a scientific grade CCD detector. Background technique [0002] At present, there is no relevant refrigeration device in China for the precise temperature control of scientific grade CCD detectors for photoelectric performance testing. Only when some manufacturers calibrate the performance of CCD devices, the detectors are refrigerated. The performance calibration of the CCD device was carried out under the environment of ℃. In practical applications, the photoelectric properties of CCD devices are generally tested at room temperature, and the operating temperature of the detector cannot be controlled during the entire test process. [0003] The cooling technologies currently used in CCD cameras include classic Dewar refrigeration and semiconductor refrigeration. Semiconductor refrigeration mainly uses thermoelectric coolers that work...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02F25D31/00
CPCG01M11/0207F25D31/005
Inventor 姚萍萍许孙龙陈怀军于新宇王羿孙亮骆冬根洪津
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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