Preparation method of epitaxial wafer with Bragg reflector
A technology of Bragg reflectors and epitaxial wafers, which is applied in the direction of semiconductor devices, electrical components, circuits, etc., can solve problems that affect the reflective performance of Bragg reflectors, lattice mismatch, and the roughness quality of Bragg reflectors is not good enough, so as to improve Microscopic crystal quality and interlayer quality, reasonable roughness, and the effect of improving light extraction efficiency
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[0034] In order to make the objectives, technical solutions and advantages of the present disclosure clearer, the embodiments of the present disclosure will be further described in detail below with reference to the accompanying drawings.
[0035] Unless otherwise defined, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this disclosure belongs. The terms "first," "second," "third," and similar terms used in the description and claims of this disclosed patent application do not denote any order, quantity, or importance, but are merely used to distinguish the various components . Likewise, "a" or "an" and the like do not denote a quantitative limitation, but rather denote the presence of at least one. Words like "including" or "comprising" mean that the elements or items listed before "including" or "including" cover the elements or items listed after "including" or "including" and their equiva...
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