Semiconductor device driving circuit and test method thereof

Abstract

The invention discloses a semiconductor device driving circuit and a test method thereof. The semiconductor device driving circuit comprises a comparator A1, a first resistor R1, a second resistor R2 and a light emitting diode group. When the light-emitting diode is short-circuited or damaged, the torsion spring rebounds through the elastic force, the torsion spring drives the whole placing frame to rotate clockwise through the clamping head, the spring pulls back through the elastic force, then the two extrusion plates are gradually away from each other, at the moment, the connecting pipe recovers to the original shape, and the connecting pressure between the connecting pipe and the light-emitting diode is reduced; the placing frame rotates clockwise on the inner side of the screw groove by using the screw strip, and the elastic force of the torsional spring enables the placing frame to move upwards in the rotating process until the screw strip is separated from the screw groove, and the elastic force of the torsional spring enables the whole placing frame to bounce from the inner side of the through groove, so that the damaged light-emitting diode can be directly taken out from the testing device. The testing continuity of a plurality of light-emitting diodes is ensured, and the testing precision of other light-emitting diodes is improved at the same time.

Description

technical field [0001] The invention belongs to the technical field of circuit testing, and particularly relates to a semiconductor device driving circuit and a testing method thereof. Background technique [0002] LED has the advantages of small size and low cost, so people often use LED for signal detection of some systems, and judge whether the signal in the system is connected by whether the LED light is lit during system test. As a low-voltage, DC semiconductor device, LED needs to work in a constant current environment. In general, the mains power supply is usually used for power supply of the system. If the LED is required to emit light when the system is detected, the AC voltage needs to be rectified and controlled by the drive circuit for the LED to use. From the electrical characteristics of the LED, it can be known that the average forward current of the LED increases linearly with the increase of the forward voltage. The change of the forward voltage of the LED ...

AI Technical Summary

Problems solved by technology

It can be seen from the electrical characteristics of LEDs that the average forward current of LEDs increases linearly with the increase of forward voltage, and the change of forward voltage of LEDs after forward conduction will cause great changes in the current on LEDs. , and the current has a great influence on the junction temperature of the LED. Excessive current can easily cause the LED to be damaged due to the rise of the junction temperature.

[0003] When the LED is damaged, the entire circuit needs to be cut off before the damaged LED can be taken out, but other normal LEDs may be damaged after the circuit is cut off, and the measurement accuracy of the LED cannot be guaranteed

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