Touch test device and method based on infrared diode

Abstract

The invention discloses a touch test device and method based on an infrared diode. The touch test device comprises a test signal generation circuit and a controllable capacitor module, the test signal generation circuit receives a control instruction sent by test equipment and generates a current signal based on the control instruction; the controllable capacitance module receives the current signal and outputs a PN junction capacitance value corresponding to the current signal, the controllable capacitance module is connected to a touch panel of the product to be tested through a probe, and a touch circuit connected with the touch panel is triggered based on the PN junction capacitance value; the controllable capacitor module comprises an infrared emitting diode and an infrared receiving diode; the infrared emitting diode receives the current signal and outputs infrared light with corresponding illumination intensity based on the current signal; the infrared receiving diode is connected with the probe and is used for receiving the infrared light output by the infrared emitting diode and outputting a corresponding PN junction capacitance value; the device can achieve the purpose of effectively testing and controlling the sensitivity of the touch circuit.

Description

technical field [0001] The present invention relates to the technical field of touch testing, in particular to an infrared diode-based touch testing device and method. Background technique [0002] At present, the mainstream TWS earphones all use capacitive touch (Cap Touch) as the human-computer interaction method; the touch sensitivity of earphones produced by mass production of capacitive touch or different touch solutions is quite different, and some are too sensitive to easily lead to false triggering. , some have low sensitivity and need to be triggered multiple times to succeed, which ultimately leads to a great decrease in user experience comfort; therefore, the current TWS headsets produced in the industry generally suffer from customer complaints or customer refunds due to too much sensitivity deviation. [0003] The reasons for the difference in sensitivity are mainly divided into two parts. The first part is that the sensitivity difference between different touch...

AI Technical Summary

Problems solved by technology

[0002] At present, the mainstream TWS earphones all use capacitive touch (Cap Touch) as the human-computer interaction method; the touch sensitivity of earphones with mass-produced capacitive touch or different touch solutions varies greatly, and some are too sensitive to easily lead to false triggering , some have low sensitivity and need to be triggered multiple times before they are successful, which eventually leads to a great decrease in user experience comfort;

[0003] The reason for the difference in sensitivity is mainly divided into two parts. The first part is that the sensitivity difference between different touch circuits is large, but it is impossible to screen out defective products; the second part is caused by the structural error of the earphone; if the structural error is considered in the design Finally, while controlling the sensitivity of the touch circuit within a reasonable range, the touch sensitivity of the final TWS headset can be effectively controlled, but the current touch test device needs to simulate a touch device (driven by a mechanical device or manually removed) Touch) for testing, and there is a defect that the sensitivity cannot be adjusted, such as adjusting the sensitivity, the defect that the structural device needs to be replaced, and the current touch test device still has problems such as complicated production and high cost

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