High reflective surface three-dimensional reconstruction algorithm based on structured light

A 3D reconstruction, highly reflective technology, applied in computing, computer parts, optical devices, etc., can solve problems such as lack of credentials, avoid manual selection, and improve reconstruction accuracy.

Pending Publication Date: 2022-07-29
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the selection of exposure time series and stripe brightness series, it is only manually selected according to the characteristics of the surface to be measured, lacking the necessary credentials

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High reflective surface three-dimensional reconstruction algorithm based on structured light
  • High reflective surface three-dimensional reconstruction algorithm based on structured light
  • High reflective surface three-dimensional reconstruction algorithm based on structured light

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] The technical solutions of the present invention will be described in detail below with reference to the accompanying drawings, but the protection scope of the present invention is not limited to the embodiments.

[0045] The present invention proposes a three-dimensional reconstruction algorithm for highly reflective surfaces based on structured light. The specific flow chart is as follows: figure 1 As shown, the main steps are as follows:

[0046] Step 1: The projector projects white light, and the camera collects white light images under different exposure times and stripe brightness. The number of measurements is n and m times, respectively, and two small data sets with capacities n and m are constructed. In the example, n and m are both is 50, the construction effect is as follows figure 2 shown;

[0047] Step 2: Screen out the pixels that have completed the conversion from under-exposure to over-exposure in the acquisition process, and obtain the estimated expo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a structured light-based high reflective surface three-dimensional reconstruction algorithm, and provides a selection method of an exposure time sequence and a stripe brightness sequence based on a multiple exposure method and a projection stripe intensity adjustment method in a high dynamic range technology. An exposure time sequence and a stripe brightness sequence are calculated by using a statistical histogram of the number of surface overexposure pixel points of a measured object under different projection conditions and combining a non-overexposure proportion of the number of pixel points in an image. The sequence is used for collecting and fusing images of a measured object, then reconstruction is carried out according to a projection grating phase method, binocular system calibration, phase information extraction and phase stereo matching are respectively carried out, and finally three-dimensional point cloud data of the high-reflection surface can be obtained.

Description

technical field [0001] The invention belongs to the field of machine vision and three-dimensional reconstruction, and in particular relates to a three-dimensional reconstruction algorithm for a highly reflective surface based on structured light. Background technique [0002] With the further deepening of scientific research, the two-dimensional information of objects has gradually been unable to meet the needs of measurement, and the three-dimensional topographic information has attracted more and more people's attention. Among the three-dimensional topography measurement technology, structured light three-dimensional reconstruction technology has been widely used in medical, military and industrial fields due to its advantages of high speed, high precision and non-contact. The topography measurement of non-reflective surfaces has become increasingly mature, but the reconstruction of highly reflective surfaces is still the focus and difficulty in research. [0003] In view...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/80G06T7/62G06T7/41G06V10/44G01B11/24
CPCG06T7/85G06T7/62G06T7/41G06V10/44G01B11/2433G06T2207/20221G06T2207/10028
Inventor 迟云鹏刘文波徐方
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap