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Memory testing method and device

A memory test and memory technology, applied in the storage field, can solve the problem of low test efficiency, improve test efficiency, meet pressure requirements, and achieve simple results

Active Publication Date: 2022-08-09
摩尔线程智能科技(北京)有限责任公司
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Problems solved by technology

However, when using existing memory testing methods for stability testing, the testing efficiency is not high

Method used

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Embodiment Construction

[0030] Various exemplary embodiments, features and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures denote elements that have the same or similar functions. While various aspects of the embodiments are shown in the drawings, the drawings are not necessarily drawn to scale unless otherwise indicated.

[0031] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments.

[0032]In addition, in order to better illustrate the present disclosure, numerous specific details are given in the following detailed description. It will be understood by those skilled in the art that the present disclosure may be practiced without certain specific details. In some instances, methods, means, components an...

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Abstract

The invention relates to a memory testing method and device.The method is applied to a processor and used for conducting stability testing on a first memory connected with the processor, the processor comprises a plurality of processing units and a plurality of first logic circuits, and the processing units conduct direct memory access on the first memory through the first logic circuits. The method comprises the steps that under the condition that a memory test instruction is received, a preset round of data migration test is executed in a multi-host data access mode through a plurality of processing units and a plurality of first logic circuits; and under the condition that the test result of the preset round meets the condition, determining that the stability test result of the first memory passes the test. According to the embodiment of the invention, the test efficiency during the memory stability test can be effectively improved.

Description

technical field [0001] The present disclosure relates to the field of storage technologies, and in particular, to a memory testing method and device. Background technique [0002] As an important part of electronic equipment, memory is very important for its stability. When the memory is unstable, the electronic device often cannot load programs and data properly, resulting in the electronic device not functioning properly. Therefore, before an electronic device leaves the factory, its memory is usually tested for stability. However, when using existing memory testing methods for stability testing, the testing efficiency is not high. SUMMARY OF THE INVENTION [0003] In view of this, the present disclosure proposes a memory testing method and apparatus. [0004] According to an aspect of the present disclosure, a memory testing method is provided. The method is applied to a processor for performing stability testing on a first memory connected to the processor, and the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2273
Inventor 罗建洪杨珏马少阳杨上山
Owner 摩尔线程智能科技(北京)有限责任公司
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