Optical recording medium
A technology for optical recording media and recording layers, applied to optical recording carriers, recording carrier materials, recording layers, etc., can solve problems such as jitter, reflectivity decline, and recording composition characteristics decline
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0065] Each layer was formed on a polycarbonate resin substrate 1 having a diameter of 120 mm and a plate thickness of 0.6 mm. Grooves are formed on the substrate 1 with a track pitch of 0.74 μm. The groove depth is 30 nm, and the ratio of the groove width to the island width is about 40:60.
[0066] First, degas the vacuum container to 1×10 -5 After Pa, at 2×10 -1 In the Ar gas atmosphere of Pa, according to the high-frequency magnetron sputtering method, a layer thickness of 60nm was formed on the substrate 1 with the addition of 20mol% SiO 2 The first protective layer 2 of ZnS.
[0067] Next, in a mixed gas atmosphere of Ar and nitrogen, use a Ge target added with 20 mol% Cr to sputter the interface layer 3 with a layer thickness of 2 nm, and then use a single target of four elements consisting of Ag, In, Sb, and Te in sequence Laminate a recording layer 4 with a layer thickness of 18nm, laminate a second protective layer 5 with a layer thickness of 5nm with the same ma...
Embodiment 2
[0072] As the recording layer 4, the same optical recording medium as in Example 1 was produced except that a Ge-Sb-Te alloy was used. When the same measurement as in Example 1 was carried out, either condition a or condition b was as shown in Table 1 and Table 2, and almost the same characteristics as in Example 1 were obtained.
[0073] recording layer
[0074] recording layer
[0075] The same optical recording medium as in Example 1 was produced except that a Ge-Ti alloy target was sputtered to form a light-absorbing heat-generating layer 6 (refractive index: 3.8, attenuation coefficient: 3.4) with a film thickness of 2 nm. (Example 4)
Embodiment 4
[0076] The same optical recording medium as in Example 1 was produced except that a Si-Cr alloy target was sputtered to form a light-absorbing heat-generating layer 6 (refractive index: 3.9, attenuation coefficient: 3.7) with a film thickness of 2 nm. (Example 5)
PUM
| Property | Measurement | Unit |
|---|---|---|
| thickness | aaaaa | aaaaa |
| thickness | aaaaa | aaaaa |
| reflectance | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More 