Composite switching array and branching apparatus testing method therewith
A switch array, composite technology, applied in electrical switches, circuits, digital transmission systems, etc., can solve the problems of bit error testing, low efficiency, difficult to improve test efficiency, etc., and achieve the effect of rapid testing
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[0025] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0026] figure 1 , figure 2 and image 3 The test method shown has been described in detail in the background art.
[0027] Figure 4 It is a structural diagram of the test system of the branch circuit equipment involved in the present invention. Such as Figure 4 As shown, the test system is composed of a bit error test device, a switch array, a tested branch device, and a cross-connect device. The bit error testing equipment sends out test signals and receives the signals from the branch equipment to judge the bit error of the received signal; the switch array connects the bit error testing equipment and the tested branch equipment; the function of the cross-connection equipment is to realize the tested The loopback of each branch signal of the branch device enables the signal received by each branch to be sent from the sending end of ...
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