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Micro-displacement measuring system and based on semiconductor laser-charge coupler

A measurement system and charge-coupled technology, applied in the field of direct and reflective optical structures, can solve the problems of different technical solutions and high prices, and achieve the effect of real measurement results, convenient operation and guaranteed accuracy

Inactive Publication Date: 2005-12-28
NANJING AUTOMATION INST OF WATER CONSERVANCY & HYDROLOGY MINIST OF WATER RESOURCES
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  • Summary
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, domestically, there is no successful product of this measurement system utilizing semiconductor laser (LD) and charge-coupled sensor (CCD); its main technical index of this type of measurement system is equivalent to the present invention in the world, and the specific technical scheme is different, And the price is very expensive

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  • Micro-displacement measuring system and based on semiconductor laser-charge coupler
  • Micro-displacement measuring system and based on semiconductor laser-charge coupler
  • Micro-displacement measuring system and based on semiconductor laser-charge coupler

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Embodiment Construction

[0070] The invention realizes non-contact precision measurement of size and displacement within the measurement range of 0 to hundreds of millimeters, and adopts LD with excellent service life and optical performance.

[0071] According to the different conditions of the measured object W, direct or reflective measurement is used, and CCD with excellent sensitivity and dark current performance is used as the photoelectric conversion element. By carefully and reasonably adjusting the cooperation between LD, optical device and CCD, the The output of the CCD is critically saturated when receiving a signal, and basically has no output when there is no signal. The CCD output uses broadband operational amplifiers (LF411, etc.) and high-speed comparators to complete DC blocking, smoothing, and binarization to ensure that the size or displacement to be measured is accurately reflected, and the time relationship and size are obtained with D flip-flops and analog switches. Or the rectan...

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Abstract

A system for measuring micro-displacement based on semiconductor laser - electric charge coupling component consists of semiconductor lased, optical device, electric charge coupling transducer, driving circuit, exciting circuit, signal recuperating unit, time - voltage converting unit, digital collecting and processing unit and digital table. It features that optical structure is set to be either directly shining structure or reflecting structure and the system is non- contact measuring system.

Description

technical field [0001] The invention relates to a laser non-contact measurement system of precision size and micro-displacement; specifically, it relates to a direct-ray and reflective optical structure, an LD drive circuit, a CCD excitation circuit, a signal conditioning unit, and a time-voltage conversion unit. Background technique [0002] In modern industrial production and engineering technology, precise size and micro-displacement measurement are more widely required. They may be static or dynamic measurement, online or offline detection, and the detection accuracy is from 1 micron to 10 microns to tens of microns. number, and more and more non-contact measurement is required, and higher requirements are put forward for long-term stability and environmental adaptability of use. The most typical in the industry is the online detection of machining dimensions, and the most typical in engineering applications is the dam deformation monitoring. [0003] At present, domest...

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Application Information

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IPC IPC(8): G01B11/02
Inventor 陈昌浩倪焕明杨志陈方胤
Owner NANJING AUTOMATION INST OF WATER CONSERVANCY & HYDROLOGY MINIST OF WATER RESOURCES