Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Stage apparatus and exposure apparatus

Inactive Publication Date: 2008-02-14
NIKON CORP
View PDF17 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0012] According to the first aspect of the present invention, it is possible to attain a further reduction in weight while scarcely lowering the necessary characteristics by raising the density of the material at the portions among the predetermined member where comparatively high rigidity, strength and degree of flatness are required, and lowering the density of the material at the other portions.
[0015] According to the third aspect of the present invention, it is possible to reduce the weight of the mirror while maintaining the degree of flatness of the reflecting surface at a high level, and thus possible to reduce the weight of the exposure apparatus.

Problems solved by technology

When for example moving members in the stage system are made thin in order to lighten the stage system, difficulties related to manufacturing technology increase, which may lead to higher manufacturing costs.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Stage apparatus and exposure apparatus
  • Stage apparatus and exposure apparatus
  • Stage apparatus and exposure apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] An example of a preferred embodiment of the present invention shall be described hereinbelow with reference to the drawings. The present embodiment is one in which the present invention is applied to a scanning exposure-type projection exposure apparatus (exposure apparatus) known as a scanning stepper.

[0026]FIG. 1 shows the schematic configuration of a projection exposure apparatus 10 of the present embodiment. In FIG. 1, the Z axis is taken that is perpendicular to the object surface (which is parallel to the image plane) of a projection optical system PL that is provided in the projection exposure apparatus 10; the Y axis is taken in the scanning direction of a reticle R and a wafer W during scanning exposure in the plane that is perpendicular to the Z axis; and the X axis is taken in the non-scanning direction perpendicular to the scanning direction (the direction perpendicular to the page in FIG. 1).

[0027] The projection exposure apparatus 10 of the present embodiment ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A wafer stage system moves a wafer stage that retains a wafer via a wafer holder along a wafer base. For example, the wafer holder is formed from a material whose density is not uniform, such that the portion that includes the reflecting surface that reflects a measuring beam for position measurement is a high-density portion, and the other portions are low-density portions. Or, the wafer stage is formed from a material whose density is not uniform, such that the portion that includes the surface that constitutes a gas bearing is a high-density portion, and the other portions are low-density portions.

Description

CROSS-REFERENCE TO RELATED APPLICATION [0001] The present application claims priority on Japanese Patent Application No. 2006-194890, filed Jul. 14, 2006, the content of which is incorporated herein by reference. BACKGROUND [0002] 1. Field of the Invention [0003] The present invention relates to a stage apparatus for driving an object, being suitably used for a stage system of an exposure apparatus that is used for transferring a mask pattern onto a substrate in a photolithography process for manufacturing devices such as semiconductor elements, imaging elements, liquid-crystal display elements, or thin-film magnetic heads and the like. [0004] 2. Related Art [0005] In a photolithography process for manufacturing devices such as semiconductor elements or liquid-crystal display elements (electronic devices, micro-devices, and the like), in order to project and expose via a projection optical system a circuit pattern formed on a reticle (or photomask) onto a wafer (or glass plate etc.)...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G03B27/54G03B27/58
CPCH01L21/682G03F7/70716G03F7/7015G03F7/70233G03F7/70725G03F7/70758
Inventor SHIBAZAKI, YUICHI
Owner NIKON CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products