Semiconductor device

Inactive Publication Date: 2010-04-29
PANASONIC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0030]The above configuration improves the heat dissipation of the buffer resin material.
[0031]As described above, in a chip-stacked semiconductor device in which semiconductor chips are stacked one on another on a metal plate (die pad) high in heat conductivity for obtaining high heat dissipation performance, there is a high risk, caused by the difference in the coefficient of linear expansion depending the component materials and heat, that the semiconductor chips and the metal plate may warp and the sealing resin material may peel off from these components due to failure in balancing of the internal stress.
[0032]According to the present invention, the region of the metal plate, which also serves as the heat dissipation plate, excluding the contact portion thereof with the semiconductor chip is coated with a low-elastic resin material as a buffer, or otherwise a cross-sectional structure high in anchor effect is adopted for the metal plate, and yet an area large enough to ensure heat conduction is guaranteed.
[0033]Specifically, a step portion is provided in the center of the metal plate, to have a flat face smaller in area than the chip size. With this, warping due to the stress with chip attachment in the fabrication process can be reduced, and the flatness of the top face of the semic

Problems solved by technology

The conventional multi-chip semiconductor device described above, which includes a plurality of semiconductor chips stacked one upon another, is large in the number of signal buses and power consumption.
However, since the coefficient of linear expansion is greatly differen

Method used

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  • Semiconductor device
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Examples

Experimental program
Comparison scheme
Effect test

Example

[0043]Example Embodiment 1 will be described with reference to the relevant drawings.

[0044]FIG. 1 diagrammatically shows a cross-sectional configuration of a chip-stacked semiconductor device of example Embodiment 1.

Example

[0045]As shown in FIG. 1, the semiconductor device of Embodiment 1 includes: a plurality of leads 1 of a lead frame made of a metal; a die pad 2 that is placed in a region surrounded by the plurality of leads 1, is made of a metal, serves also as a heat dissipation plate and has an upset portion 2a in the center upset with respect to its surroundings; and first and second semiconductor chips 3A and 3B attached to the top face of the upset portion 2a of the die pad 2 via an adhesive paste 4 made of a paste resin material.

[0046]For the paste resin material, a silver(Ag)-contained epoxy resin or a silver(Ag)-contained polyimide resin may be used.

[0047]The first and second semiconductor chips 3A and 3B are attached to each other via an adhesive sheet 5 made of an elastic resin including a thermosetting epoxy component, for example. The semiconductor chips 3A and 3B are connected to the inner ends of the leads 1 via metal wires 6 made of gold (Au).

[0048]The die pad 2, the semiconductor c...

Example

[0072]Example Embodiment 2 will be described with reference to the relevant drawings.

[0073]FIG. 5 diagrammatically shows a cross-sectional configuration of a chip-stacked semiconductor device of example Embodiment 2. In FIG. 5, the same components as those in FIG. 1 are denoted by the same reference numerals, and description thereof is omitted in this embodiment.

[0074]In Example Embodiment 2, in place of covering the peripheral portion of the die pad 2 other than the upset portion 2a with the buffer resin material 9, a down-set portion 2b is placed to surround the upset portion 2a. The down-set portion 2b is essentially composed of at least one groove protruding from the bottom face (face opposite to the face close to the first semiconductor chip 3A) of the die pad 2. In this embodiment, the down-set portion 2b is formed at a position under the first semiconductor chip 3A.

[0075]With placement of the down-set portion 2b, which forms a protrusion on the back face of the die pad 2, a p...

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Abstract

The semiconductor device includes: a semiconductor chip; a die pad for holding the semiconductor chip; a lead; and a sealing resin material for sealing the semiconductor chip, the die pad and an inner portion of the lead. The die pad has an upset portion protruding upward to form a flat face smaller in area than the semiconductor chip, and the portion of the die pad excluding the upset portion is covered with a buffer resin material smaller in elasticity than the sealing resin material.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application claims priority under 35 U.S.C. §119 on Patent Application No. 2008-278088 filed in Japan on Oct. 29, 2008 and Patent Application No. 2009-73699 filed in Japan on Mar. 25, 2009, the entire contents of which are hereby incorporated by reference.BACKGROUND OF THE INVENTION[0002]The present invention relates to a semiconductor device including at least one semiconductor chip sealed in a package.[0003]At present, a standardized surface-mount type semiconductor package is configured as follows: a semiconductor chip is fixed to a die pad of a lead frame made of a cupper (Cu) alloy or an iron-nickel (Fe—Ni) alloy by die bonding, a bonding pad (electrode pad) of the semiconductor chip and the end of each lead of the lead frame are wire-bonded to each other with a metal wire made of gold (Au) and the like, and the resultant chip is resin-molded using a mold having a predetermined shape.[0004]In recent years, with the progression o...

Claims

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Application Information

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IPC IPC(8): H01L23/485
CPCH01L23/4334H01L23/49503H01L23/49575H01L2224/32014H01L2224/32145H01L24/48H01L2224/48247H01L2224/73265H01L2924/01079H01L2924/3511H01L2224/32245H01L2224/48095H01L2924/00014H01L2924/00012H01L2924/00H01L2224/451H01L2224/45144H01L2924/181H01L24/73H01L2224/32055H01L24/45H01L2924/00015H01L2224/05599H01L2224/45015H01L2924/207
Inventor SATOU, MOTOAKI
Owner PANASONIC CORP
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