High-speed analog photon counter and method

Abstract

A high speed analog photon counter and method is provided. In one aspect, the method includes delivering an electric charge to a circuit of the high speed analog photon counter through a current source of the circuit. The method also includes accumulating the electric charge in a capacitor of the circuit electrically coupled to the current source. The method further includes comparing the electric charge accumulated in the capacitor of the circuit with a reference voltage through a comparator of the circuit electrically coupled to an output of the capacitor. The output of the capacitor of the circuit is coupled to an input of the comparator of the circuit, and the reference voltage is coupled to another input of the comparator of the circuit. The method furthermore includes resetting the capacitor of the circuit when the electric charge accumulated in the capacitor of the circuit matches the reference voltage.

Description

CLAIM OF PRIORITY[0001]This application is a divisional application of U.S. patent application Ser. No. 12 / 876,174 titled HIGH-SPEED ANALOG PHOTON COUNTER AND METHOD filed on Sep. 6, 2010.FIELD OF TECHNOLOGY[0002]Embodiments of the disclosure relate generally to the field of image sensing and, more particularly, to high speed analog photon counter and method.BACKGROUND[0003]A measurement device may count individual photons incident on the measurement device to measure an intensity of a light (e.g., an image sensor). For example, an image sensor may count incident photons until a threshold count of incident photons is reached. A measure of light intensity and / or flux may be obtained through counting the number of incident photons. The measurement device may determine the light intensity through a digital counter. A threshold detector may detect a count threshold from the digital counter in a time domain imaging operation.[0004]A circuit to implement the digital counter and the thresh...

AI Technical Summary

Benefits of technology

[0011]The n-number may be determined through a threshold value of a fill factor of the pixel, a fill factor of the pixel being an area occupied by an active area of a photodiode as compared to a combined layout area of the photodiode, the circuit, the n-number of the circuit, the comparator and the current source in the pixel. The maximum number of incident photons that the circuit can count may be incremented to increase a dynamic range of a measurement device. The serial coupling of the n-number of the circuit may reduce the sensitivity requirements of the comparator through limiting the maximum count of each stage to have a large count step size.

[0012]In another aspect, a method includes accumulating an elec

Problems solved by technology

The large layout area of the circuit may prevent an implementation of the circuit inside a pixel of the measurement device.

An inability to use the circuit inside the pixel may limit a speed of operation of the measurement device (e.g., frame rate).

If the circuit is used inside the pixel, the circuit may increase the pixel size and/or may reduce a reso

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