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Physical unclonable function cell and array

a function and array technology, applied in the field of physical unclonable functions, can solve the problems of difficult prediction, difficult duplicate of puf devices, and difficult to manufacture, and achieve the effect of relatively simple fabrication, unclonable functions, and difficult prediction

Inactive Publication Date: 2013-08-29
IBM CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patent describes a function cell system that includes two FET devices and a phase comparator. The system detects the transconductance factor of the FET devices and compares it. The system can output a bit value based on the comparison of the FET devices. This invention allows for the accurate and efficient detection of FET devices in a function cell system.

Problems solved by technology

A physical unclonable function (PUF) is a function that is arranged in a physical structure that is typically easily evaluated, but difficult to predict.
A PUF device should be very difficult to duplicate, but relatively simple to fabricate.

Method used

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  • Physical unclonable function cell and array
  • Physical unclonable function cell and array
  • Physical unclonable function cell and array

Examples

Experimental program
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Embodiment Construction

[0021]FIG. 1 illustrates a block diagram of an exemplary embodiment of a physical unclonable function (PUF) cell 100. The PUF cell (cell) 100 includes a first field effect transistor device (FET) 102a and a second FET 102b. The FETs 102a and 102b are substantially similar in that they have been designed and fabricated such that they each have substantially similar structures and electrical characteristics. For typical electronic applications the FETs 102a and 102b could be considered identical components. However, even if a pair of FETs are intended by a designer and manufacturer to be substantially identical, a pair of substantially identical FETs will exhibit different device parameters due to the randomness of intrinsic physics and manufacturing process. Transconductance factor (gm) is one of the device parameters that differs between devices. In this regard, the gm variations may be determined by two methods, drain gm (D-gm) and body leakage gm (B-gm). More specifically,

D−gm=d(I...

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PUM

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Abstract

A function cell comprising a first field effect transistor (FET) device, a second FET device, a first node connected to a gate terminal of the first FET device and a gate terminal of the second FET device, wherein the first node is operative to receive a voltage signal from an alternating current (AC) voltage source, an amplifier portion connected to the first FET device and the second FET device, the amplifier portion operative to receive a signal from the first FET device and the second FET device, a phase comparator portion having a first input terminal connected to an output terminal of the amplifier and a second input terminal operative to receive the voltage signal from the AC voltage source, the phase comparator portion operative to output a voltage indicative of a bit of a binary value.

Description

BACKGROUND[0001]The present invention relates to unclonable functions, and more specifically, to physical unclonable functions.[0002]A physical unclonable function (PUF) is a function that is arranged in a physical structure that is typically easily evaluated, but difficult to predict. A PUF device should be very difficult to duplicate, but relatively simple to fabricate.[0003]A PUF generates a set of bits, for example, 128 bits to form a matrix A. During operation the calculation Y=A*X is performed, where A is a matrix having elements generated from the PUF, X is an input vector called a “challenge,” and Y is the output vector called the “response.”[0004]The matrix A and the input vector should only be known to the chip owner such that only the owner may know if the response is correct.[0005]Typical PUF characteristics include stable bit generation from the PUF that remain fixed over time, and correlation among the bits generated from similar PUF structures should be random.SUMMARY...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H03D13/00
CPCH03K5/156H03K5/1534
Inventor FENG, KAI D.WANG, HAILINGWANG, PING-CHUANYANG, ZHIJIAN
Owner IBM CORP