Method and circuit for detecting a fault in a clock signal for microprocessor electronic devices including memory elements
Patent Information
- Authority / Receiving Office
- US · United States
- Current Assignee / Owner
- STMICROELECTRONICS SRL
- Publication Date
- 2003-06-24
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
CROSS REFERENCE TO RELATED APPLICATIONThe present application is related to U.S. patent application Ser. No. 08 / 414,919 entitled "CIRCUIT FOR DETECTING A FAULT IN A CLOCK SIGNAL FOR MICROPROCESSOR ELECTRONIC DEVICES" filed of even date herewith by the inventors hereof and assigned to the assignee herein, and incorporated by reference herein.BACKGROUND OF THE INVENTION1. Field of the InventionThe present invention relates to a circuit for detecting irregularities in a clock signal of electronic devices containing a microprocessor and non-volatile memory elements.The present invention concerns specifically two types of electronic device, to wit: microcontrollers containing EEPROM or FLASH EEPROM non-volatile memories, and FLASH EEPROM memories using internally a microprocessor for management of the reading, programming and erasing phases.The following description is given with reference to this field of application only for the purpose of simplifying discussion thereof.2. Description ...