The invention belongs to the field of
chemistry, and relates to a method and
system for directly measuring the content of
titanium carbide in
carbide slag through X-
ray diffraction. The method comprises the following steps: preparing a series of
carbide slag standard samples containing different known TiC contents; adopting an X-
ray diffraction analyzer to respectively scan the standard sample and the to-be-detected sample under the same parameter condition to obtain an XRD (X-
Ray Diffraction) spectrum; selecting a characteristic
diffraction peak of TiC at 2theta of 41.9 + / -0.2 degrees, measuring the intensity of the characteristic diffraction peak, and drawing a standard working curve by taking the TiC
mass fraction of the standard sample as an abscissa and the corresponding
peak intensity as an ordinate; and measuring the characteristic diffraction
peak intensity of a sample to be measured, substituting the characteristic diffraction
peak intensity into the standard working curve, and calculating to obtain the
mass fraction of TiC in the sample to be measured. The method has the characteristics of rapidness and accuracy, the analysis time of TiC in the carbide
slag is shortened from 2 hours to 15 minutes, the operation conditions are improved, the labor intensity is reduced, and the analysis process is greatly shortened.