This invention discloses a
pupil parameter
measuring instrument and method, including a
pupil pen and a back-end analysis and
processing platform. The pen's head, middle, and
tail are detachably connected. A miniature
infrared camera is located at the center of the pen's front end. Several
infrared supplementary lights, a visible
light source, and a distance sensor are located at the front end of the pen's head. The miniature
infrared camera, infrared supplementary lights, visible
light source, and distance sensor are all electrically connected to a flexible PCB board. A
microcontroller and a motor are located within the middle of the pen, and a display screen is located on the pen's housing. A
power module is located within the
tail of the pen. The
microcontroller is electrically connected to the flexible PCB board, the motor, and the display screen. The
pupil pen is connected to the back-end analysis and
processing platform via a
wireless communication module. This invention provides a pupil parameter
measuring instrument and method that effectively reduces the subjective errors caused by traditional
visual examination through multi-dimensional quantitative monitoring of
pupil diameter,
constriction rate, and
constriction speed.