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Large-shearing carrier-frequency electronic speckle interference displacement field separating method

An electronic speckle interference and separation method technology, applied in the separation field of carrier frequency electronic speckle interference displacement field, can solve the problems of limited development, high noise of speckle fringes, etc., and achieve stable measurement, high fringe contrast, and simple system. Effect

Inactive Publication Date: 2008-12-03
SHANDONG NORMAL UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method has also been introduced into electronic speckle interference, but the high noise of speckle fringes limits the development of this technology

Method used

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  • Large-shearing carrier-frequency electronic speckle interference displacement field separating method
  • Large-shearing carrier-frequency electronic speckle interference displacement field separating method
  • Large-shearing carrier-frequency electronic speckle interference displacement field separating method

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Experimental program
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Embodiment

[0018] Large shear electron speckle interference carrier frequency modulation optical path such as figure 1 shown. The laser beam is split into two beams: through variable beam splitter 1, reflector 9 and beam expander 7, it becomes illumination light 11; through variable beam splitter 1, reflector 2, reflector 10 and beam expander 8, it becomes Illumination light12. Adjusting the variable beam splitter 1 can make the intensity of the illumination light 11 and the illumination light 12 equal. A reference object 14 is fixedly placed next to the measured object 13, and both the illuminating light 11 and the illuminating light 12 can simultaneously illuminate the two objects. When the illumination light 11 or the illumination light 12 illuminates the object, the diffusely reflected light of the object passes through the large shearing prism 6 and the polarizer 5 , and then enters the camera 3 through the lens 4 .

[0019] The normal incident light beam enters the prism 6, and ...

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Abstract

A separating method for large shear carrier speckle interference displacement field is provided. The separating method is: in the system of shear electron speckle interference, mounts a reference beside the object to be measured, use symmetrical double light beam to illuminate the measuring object and the reference; the speckle interference is realized via large shear optical prism, the deflection of inference is introduced to the carrier modulation stripe; according to the value of deformation, deflects the angular of reference to adjust the spatial frequency to realize the modulation of displacement field; bending deformation of the carrier strip of measuring object is occurred by the deformation of the object; using the method of Fourier transformation, two phase diagrams containing the information of the separation surface and the inner surface displacement is obtained by demodulation; after enveloping the two-phase graphic analysis, the inner surface displacement field and the separation surface field are separated by algebraic computation. The advantages of invention are high quantity of modulation stripe, simple structure and don't need reference light. It can measure dichotomic component of the deformation field of body fast and stably.

Description

technical field [0001] The invention relates to a separation method of frequency carrier electron speckle interference displacement field. Background technique [0002] Shearing electronic speckle interferometry has the advantages of simple optical path, high degree of automation, low requirements for shock resistance, and direct measurement of the derivative field of displacement. It is widely used in the field of nondestructive testing. The shearing electronic speckle interferometry technology of the large dislocation crystal prism (Wollaston prism) can realize the displacement measurement of the speckle interferometry, which has the advantages of simple system, no special introduction of reference light, and good fringe quality. In order to analyze the interference fringes of the deformation field with high precision, the phase shift method and the carrier wave method are commonly used to realize the phase measurement of the deformation field. Compared with the phase shi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/02G01B11/16G01B9/02
Inventor 孙平
Owner SHANDONG NORMAL UNIV
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