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Timer resolved photoelectron amplifying X-ray microscope

A time-resolved, optoelectronic technology, used in X-ray equipment, electrical components, analytical materials, etc., can solve the problems of lack of amplification system, hinder development, inability to record and display in real time, and achieve high magnification.

Inactive Publication Date: 2009-08-12
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the biggest disadvantage of X-ray microscopy is the lack of necessary magnification system, which cannot be recorded and displayed in real time, which hinders its development to a large extent.

Method used

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  • Timer resolved photoelectron amplifying X-ray microscope

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Embodiment Construction

[0030] see first figure 1 , figure 1 It is a schematic diagram of the optical path structure of the time-resolved photoelectron magnified X-ray microscope of the present invention. It can be seen from the figure that a time-resolved photoelectron magnified X-ray microscope includes a femtosecond laser system 1, and is characterized in that it also includes a beam splitter 2, a mirror 3, Photocathode X-ray diode 4, optical delay line composed of first total reflection mirror 21, second total reflection mirror 22, third total reflection mirror 23, concave reflector 5, sample to be tested 7, optoelectronic amplification system 8 and computer 9. The positional relationship of each component is as follows: a beam splitter 2 is placed on the output optical path of the femtosecond laser system 1, and the laser output from the femtosecond laser system 1 forms a transmitted B beam and a reflected A beam through the beam splitter 2, wherein After the A beam passes through the optical d...

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Abstract

A time-resolved photoelectron magnified X-ray microscope is composed of a femtosecond laser system, a beam splitter, a mirror, a photocathode X-ray diode, an optical delay line, a concave mirror, a concave focusing single crystal, a photoelectron magnification system and a computer. The invention utilizes the strong penetrability of X-rays to detect the sample, and turns the image of the sample into photoelectron and then enlarges it, which saves the microscopic fixing process. It has both the advantages of X-rays and electron beams, and abandons their respective shortcomings , can display images at high magnification in real time.

Description

technical field [0001] The invention relates to an X-ray microscope, in particular to a time-resolved photoelectron magnified X-ray microscope, which has broad application prospects in material science, biomedicine and scientific research. Background technique [0002] Limited by the wavelength (400-700nm), it is difficult for the resolution of the optical microscope to break through the diffraction limit of 200nm. Using confocal scanning imaging can improve the point spread function of the system, thereby breaking through the diffraction limit and increasing the resolution by an order of magnitude. Scanning imaging using diffraction from pinholes with apertures much smaller than the wavelength, using so-called near-field scanning microscopy, can also increase this resolution limit by more than an order of magnitude. Unfortunately, the above two microscopy methods are only suitable for surface imaging due to the poor penetration of visible light. Near-infrared light has a l...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/083G01N23/04H05G1/02
Inventor 陈建文高鸿奕朱化凤干慧菁李儒新徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI