Optical fiber spectrometer wavelength calibration method

A fiber optic spectrometer and a calibration method technology are applied in the field of wavelength calibration of fiber optic spectrometers, which can solve the problems of differences in calibration results, high requirements, and large calibration errors of fiber optic spectrometers, and achieve the effect of improving calibration accuracy.

Inactive Publication Date: 2009-09-30
INST OF MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0016] In order to overcome the large error in the calibration of fiber optic spectrometers in the prior art, and the high requirements for the three standard spectral lines used for calibration, such as large span and uniform distribution, etc., and some given parameters are required, and when the given parameters take different values When , the calibration results also appear to be different

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  • Optical fiber spectrometer wavelength calibration method
  • Optical fiber spectrometer wavelength calibration method

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Embodiment Construction

[0034] Embodiments of the present invention will be specifically described below with reference to the accompanying drawings. like figure 1 As shown, it is the structure of an ordinary fiber optic spectrometer: it is composed of optical fiber 1, FC coupling probe 2, spherical mirror 3, grating 4, CCD line array 5, and computer operating system 6; the optical path adopts a horizontally symmetrical optical path, and the center of the grating is located On the axis of symmetry of the formula optical path, the FC coupling probe 2 and the CCD linear array 5 are located on the focal plane of the spherical mirror.

[0035] According to the principle of geometric optics, the optical path of the fiber optic spectrometer can be simplified to the optical path figure 2 , in the experiment, the first-order diffraction fringes are used, so it can be known from the grating equation:

[0036] d(sinβ-sinα)=λ (6)

[0037] Where: β-incident angle, α-diffraction angle, λ-wavelength (nm)

[0...

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Abstract

The invention discloses a wavelength calibration method of an optical fiber spectrometer, which comprises the following steps: A) using a standard light source, collecting a standard spectrum through a spectrometer, and determining the pixel number ki of the linear array CCD of the spectrometer receiving element corresponding to the different actual wavelength i of the standard light source ; B) select the above-mentioned arbitrary three actual wavelengths i and the corresponding pixel number ki, and obtain a1, a2, a3 according to the formula: (see the lower right formula); C) obtain a1, a2 according to step B) , a3 value, and then solve the calibration calculation wavelength value λi corresponding to each pixel number ki, and this λi is the calibration wavelength value. The calibration method of the optical fiber spectrometer proposed by the present invention has a calibration error far smaller than that in the prior art, and can use any three standard common lines to perform accurate calibration, thereby improving the flexibility of calibration.

Description

technical field [0001] The invention relates to a method for calibrating optical instruments, in particular to a method for calibrating the wavelength of an optical fiber spectrometer. Background technique [0002] Optical fiber spectrometer is an instrument that can be used for spectral measurement in the ultraviolet-visible-near-infrared spectral region. Its measurement wavelength range is generally 200-1100nm. It is widely used in chemical analysis, industrial detection, and aerospace remote sensing. In recent years, with the introduction of optical fiber, CCD and computer technology, the technology of fiber optic spectrometer has been developed rapidly, which can realize online real-time measurement, and has the advantages of information collection, processing, storage, etc., so that spectral measurement technology is widely used in industry, scientific research It has been widely used in the field. Since the light intensity absorbed or emitted by the sample to be measu...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/01G01N21/17G01J3/00
Inventor 杨乾锁彭志敏竺乃宜
Owner INST OF MECHANICS - CHINESE ACAD OF SCI
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