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Thermal control of deposition in dip pen nanolithography

A technology for thermal control and temperature control equipment, applied in the direction of devices, special surfaces, coatings, etc. that apply liquid to the surface, and can solve the problems of no start or stop deposition, no contact mode imaging, etc.

Inactive Publication Date: 2007-09-12
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, both of these references suffer from one or more of the following deficiencies: no ability to image in contact mode without contamination, no ability to start or stop deposition, and no ability to control over-diffusion of ink once deposited ability

Method used

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  • Thermal control of deposition in dip pen nanolithography
  • Thermal control of deposition in dip pen nanolithography
  • Thermal control of deposition in dip pen nanolithography

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] Deposition of OPA—The OPA-coated AFM tip described above was rastered over four 500 nm square areas of the mica substrate at 2 Hz and 128 lines / scan, or a total scan time of 256 s. For each square, the temperature of the cantilever is increased, eventually exceeding the melting temperature of OPA. When the temperature of the tip remains below the melting temperature T of OPA m At 25°C or 57°C, no drawn squares will be obtained. Increase the tip temperature to 98°C, which is close to the melting temperature T of OPA m Causes a small amount of deposition. The average height of this region is 1.1 nm, which is slightly less than half the height of the entire molecule. When the temperature of the cantilever is increased to 122°C, a firm deposition can be seen finally, and the height of the constructed square pattern is 2.5nm, as shown in Figure 3, which represents the height of the entire molecule. The corresponding tribological imaging shown in Figure 4 demonstrates OPA...

Embodiment 2

[0042] Deposition of PDDT - tDPN is used for deposition conduction of the polymer located between the electrodes. The polymer is polyethylene (3-dodecylthiophene) PDDT, which is a useful semiconducting polymer for inorganic FETs. The tip was heated to ~200°C under nitrogen conditions (to avoid oxidation). The needle tip then scans from one electrode to the other within 2 minutes. The deposited lines had a thickness of 20 nm and a width of 150 nm and spanned a wide space of 800 nm.

Embodiment 3

[0044] Indium Deposition - Important for nanoscale circuits or the repair of photomasks used to form modern circuits, is the ability to write tiny conductive lines. tDPN is used to form indium, lower melting point metals and general electric welding. Figure 7 shows a series of 3um lines written at a tip speed of 3um / s. Each line was transferred 64 times (ie, 32 draw / redraw) by the deposition tip. The two top lines written at 95°C and 135°C are not shown, and the faint line on the bottom left is drawn at 156°C, which is close to the melting temperature of indium at 156.6°C. The bottom right line was written at 196°C, which is above the melting temperature of indium and shows robust deposition at this temperature.

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Abstract

The invention discloses a device applied in the nano lithography a heat control method for making the solid organic ink deposit on the base-plate from the needlepoint of the atomic microscope. The invention can be used to start and stop the ink depositing on the base-plate by the means of increasing the temperature to higher than the fluxing temperature of the ink or decreasing the temperature to lower than the fluxing temperature of the ink. The allowance of the ink deposition can be started and stopped and the deposition rate can be changed without interruption of the contact between the needlepoint and base-plate, so that the method may be useful. Uniform needle points may used for imaging without pollution. The invention allows the ink deposition in the vacuum chamber. The invention obtains a higher spatial resolution when the ink has a lower surface mobility after cooling.

Description

[0001] This application claims the benefit of US Provisional Application No. 60 / 603,508, filed August 18, 2004, and US Nonprovisional Application No. 10 / 956,596, filed September 29, 2004. technical field [0002] The present invention relates to an apparatus and method for thermal control in deposition of dip-pen nanolithography, or DPN (Dip-Pen Nanolithography, and DPN is a registered trademark for nano-ink). Background technique [0003] The ability to make extremely small structures and patterns is the key to creating smaller and faster electrons. Some of the latest technologies are implemented in nanometers, or 10 -9 Build structures on the scale of meters. One of the techniques is DPN, which has been described in US Patent No. 6,635,311. DPN is a method for depositing molecules onto surfaces through the tip of an atomic force microscope (AFM). The method is very similar to hacking a pen into an inkwell and writing with that pen, except that the DPN is on a very tiny ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B05D5/00B05C11/00
Inventor 保罗·E·舍汉威廉姆·J·利奥耶德威廉姆·P·金
Owner THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY