Target surface focal spot monitoring device

Abstract

The present invention provides a target face focal spot monitoring device for laser target practice, and includes a parallel laser beam emitting light path, a target face imaging light path, a ray axis meeting system, and an image receiving system. The parallel laser beam emitting light path is used to emit a simulated laser beam. The target face imaging light path receives the scattered light emitted by the target face focal spot, and forms an image for the target face. The ray axis meeting system realizes the meet of the ray axis of the target face focal spot monitoring device and the ray axis of the target practice beam. The image receiving system is used to receive the image of the target face formed by the target face imaging light path and to display the image on a monitor. By calculating the size of the image of the target face received by a CCD vidicon, the actual size of the target face focal spot can be determined accurately. The device of the present invention can provide a parallel laser beam of which caliber is identical with that of the actual target practice laser beam, simultaneously can also monitor the target spot with a higher magnification to improve the adjustment precision of the target mirror, and then the efficiency of the laser target practice can be improved.

Description

technical field [0001] The invention relates to an aiming system, in particular to a device that provides simulated light beams for an ultrashort and ultrafast laser device and simultaneously monitors a focal spot on a target surface. Background technique [0002] In an ultrashort and ultrafast laser device, the laser beam is focused by the target mirror to form a focal spot on the target surface. The shape, size and position accuracy of the focal spot on the target surface play a key role in the efficiency of laser targeting. , so the adjustment of the target mirror is very important. However, due to the short emission time and high power of the actual target laser beam, it cannot be used as a reference beam for adjusting optical components. Therefore, before shooting a target, the continuously emitted simulated beam is generally used instead of the actual shooting beam as a reference beam to adjust the optical components. [0003] In the prior art, the device with the st...

AI Technical Summary

Problems solved by technology

[0005] 1. The simulated beam aperture provided is much smaller than the actual target beam, which cannot truly reflect the focal spot of the actual target beam after it is focused by the target mirror. Therefore, the simulated beam cannot be used to precisely adjust the position of the target mirror relative to the target surface.

[0006] 2. The magnification of ordinary long-focus microscopes is small, the depth of focus is large, and the measurement accuracy of the size and position of the focal spot on the target surface is low

[0007] 3. Need to occupy the observation window on the target chamber

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