SPARC processor single particle effect detection device and method

A single event effect and detection device technology, which is applied in the direction of measuring devices, electronic circuit testing, electrical digital data processing, etc., can solve the problems of lack of flexibility in hardware combination of test devices, lack of flexible configurability, poor adaptability of test software, etc., to achieve Avoid repeated operations of switching on and off the vacuum environment, facilitate debugging, and achieve effective protection

Inactive Publication Date: 2008-03-19
BEIJING MXTRONICS CORP +1
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AI Technical Summary

Problems solved by technology

The test method is single, the test program must be written into the program memory of the monitoring processor before the test, the adaptability of the hardware device to the test software is poor, and the update and reload of the online test software cannot be performed. The combination of test device hardware Lack of flexibility (i.e. different configurations of hardware structures)
Patent application number 200410083647.1, the applicant is the Space Science and Applied Research Center of the Chinese Academy of

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  • SPARC processor single particle effect detection device and method
  • SPARC processor single particle effect detection device and method
  • SPARC processor single particle effect detection device and method

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Embodiment Construction

[0033] As shown in Figure 1, it is a single processor self-test mode block diagram of the present invention; It includes a test circuit board 1, a high-speed data acquisition control unit 2, a main control computer 3, a dual-way power supply system 4, and the test circuit board 1 is provided with a current control Socket or socket of the processor under test, socket or socket of the processor under test, data memory socket or socket of the processor under test, program memory socket or socket of the processor under test, and are used for inserting into the current controller 12, the processor under test 13, the Processor data memory 14, tested processor program memory 15; dual-circuit power supply system 4 is a dual-circuit voltage source through voltage regulation, and dual-circuit power supply system 4 supplies power to the tested processor 13 separately, and the current controller 12 Placed between the processor under test 13 and the dual power supply system 4, the main cont...

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Abstract

The invention relates to a detecting device and a detecting method for the single event effect of a SPARC processor; the detecting device comprises a testing circuit board, a high-speed data collect and control unit, a main control computer and a dual-way power-supply system; through dual-thread control, the testing circuit board and the main control computer can realize simultaneous monitoring for single event latch and other single event effects; the testing circuit can be flexibly provided with a tested processor and a monitoring processor to carry out self-test and dual-processor supporting test; the hardware structure of the device can suit to all kinds of the single event effects of the SPARC processor; the device can realize the different testing for all kinds of the single event effects, and can solve the problem of measuring the single event effects of the SPARC processor in the environment of ground simulative radiation.

Description

technical field [0001] The invention relates to a detection device and method for the single event effect of a SPARC processor, which is mainly used for evaluating the sensitivity of the single event effect of the processor by an experimental method, and can provide microprocessors with anti-single event effects for aerospace, military and civilian use Ability to evaluate and measure methods. Background technique [0002] Microelectronic or optoelectronic devices used in space systems such as satellites must work in an extremely dangerous radiation environment. High-energy particles from space, the sun and the earth's capture belt will hit sensitive nodes on the device, causing permanent damage or transient damage. Events, a single high-energy particle impacting a device to generate a trajectory-related phenomenon of ionized charge is commonly referred to as a single-event effect (English: Single-event effects; abbreviated as: SEE) which can cause temporary or permanent chan...

Claims

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Application Information

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IPC IPC(8): G06F11/00G01R31/00G01R31/317
Inventor 范隆于立新刘立全贾樑祝长民
Owner BEIJING MXTRONICS CORP
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