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Device for testing electrical erosion property of electrical contact material

A technology for electric contact materials and testing devices, which is applied in the direction of measuring devices, analysis materials, instruments, etc., and can solve the problems of inability to detect the displacement of electric contacts and the lack of synchronous control functions of electric contacts.

Inactive Publication Date: 2011-11-02
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention solves the problem that the existing method for testing the electrical erosion rate of electrical contact materials cannot detect the displacement of the electrical contact pair, and does not have the synchronous control function of the relationship between the electrical contact pair's on and off actions and the power supply phase. , providing a device for testing the electrical erosion of electrical contact materials

Method used

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  • Device for testing electrical erosion property of electrical contact material
  • Device for testing electrical erosion property of electrical contact material

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Experimental program
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Effect test

specific Embodiment approach 1

[0008] Specific implementation mode one: see figure 1 , figure 2 , this embodiment is composed of an electric contact mechanical movement operation test device 1, a low voltage constant current power supply 3, an AC power supply 4, a host computer 5 and a thyristor switch 7, the anode of the thyristor switch 7 is connected to the first One power supply terminal is connected, the negative electrode of thyristor switch 7 is connected with the first power supply terminal of electric contact mechanical movement operation test device 1, the second power supply terminal of AC power supply 4 is connected with the second power supply terminal of electric contact mechanical movement operation test device 1 The power terminal is connected, the control signal input terminal of the thyristor switch 7 is connected with the control signal output terminal of the data acquisition card 6, the positive terminal of the low voltage constant current power supply 3 is connected with the first powe...

specific Embodiment approach 2

[0010] Specific implementation mode two: see figure 1 , this embodiment adds a capacitor bank 2 on the basis of the specific embodiment one, the first power supply terminal of the capacitor bank 2 is connected to the anode of the thyristor switch 7, and the second power supply terminal of the capacitor bank 2 and the electric contact mechanically move The second power supply terminal of the operating test device 1 is connected. When the AC power supply 4 adopts an ordinary AC system, it has the advantages of simplicity and directness, good waveform conditions of the power supply, and convenient voltage adjustment; the disadvantage is that the electrical capacity of the laboratory under general conditions is limited, and its experimental current level is mostly less than 100A. , and frequent on and off operations will cause serious interference to other electrical equipment in the circuit, especially electronic instruments and computer equipment, affect their service life, meas...

specific Embodiment approach 3

[0011] Specific implementation mode three: see figure 2 The difference between this embodiment and the specific embodiment 1 or 2 is that the electrical contact mechanical movement operation test device 1 includes a static contact base 8-1, a moving contact base 8-2, a force measuring device 9, a static contact 10. Moving contact 11, electromagnetic exciter 20, ejector rod 20-1, inverted T-shaped transmission rod 20-2, rectangular frame 20-3 and displacement measuring sensor 23, force measuring device 9 is arranged on the mechanical movement of electric contact On the upper end face of the inner side wall of the outer casing 1-1 of the operation testing device, the welding force signal output end of the force measuring device 9 is connected with the welding force signal input end of the data acquisition card 6, and the static contact base 8-1 is arranged on On the lower end surface of the force measuring device 9, the static contact 10 is arranged on the static contact base 8-1...

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Abstract

A device for testing the electrical erosiveness of the electrical contact material is provided, which relates to a test equipment for research on the electrical erosiveness of the electrical contact material. The invention comprises an electrical source, an electrical load, a control circuit, an executive body for operation of the electrical contact and the control and measuring system of the arcprocess. The test equipment can conveniently adjust the electric parameters of the test circuit and the correct operating parameters of the examined electrical contact, which solves the problems in the existing testing device that the current device for testing the electrical erosiveness of the electrical contact material can not detect and control the correct displacement of the electrical contact and can not realize the synchro control to the relationship between the making and breaking operation and the power phase by the electrical contact. Through the accuracy control to the correct displacement process of the electrical contact in the testing process as well as the strict restriction to the phase angle condition corresponding to the making and breaking process of the electrical contact, the device avoids the discreteness of the testing result of the electrical erosiveness of the electrical contact material, which provides equipment means and experimental basis for the research on the mechanism of the electrical erosiveness of the electrical contact material.

Description

technical field [0001] The invention relates to a test device for studying the electric erosion performance of electric contact materials, which belongs to the field of electromechanical integration equipment. Background technique [0002] Although semiconductor devices are being used more and more widely in the field of electrical industry, contact appliances still occupy a dominant position in the field of power transformation and distribution. Compared with semiconductor devices, contact appliances have the characteristics of low price, small contact resistance, good insulation performance, strong anti-overload ability, intuitive and reliable action, and good anti-interference performance. However, due to the electrical erosion of the electrical contact material of the contact electrical appliance by the arc process accompanying the switching and breaking operations, the electrical life of the contact electrical appliance is far from that of the power semiconductor device...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N33/00
Inventor 邵文柱崔玉胜甄良杨丽
Owner HARBIN INST OF TECH
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