Silicon slice with asymmetry edge contour and manufacturing method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- 宁夏中欣晶圆半导体科技有限公司
- Publication Date
- 2008-07-23
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a silicon chip with an asymmetric edge profile and a manufacturing method thereof, belonging to a semiconductor device manufacturing method using a silicon chip as a substrate in a mass production process. Background technique
[0002] Using the traditional substrate silicon wafer manufacturing method, the silicon wafer needs to go through the following steps: slicing, chamfering, grinding, etching, and polishing on one or both sides. There are two types of chamfered silicon chip edge profiles, T-shaped and R-shaped (as shown in Figure 1 and Figure 2), both of which are symmetrical profiles, that is, the front and back surfaces of the silicon chip have the same edge profile. In the subsequent wafer processing process, the backside of the silicon wafer will be thinned, as shown in the figure below the arrow in Figure 1, Figure 2, and Figure 3. The final thickness t is usually about 100 μm, and it is manufactured by traditional c...