Silicon slice with asymmetry edge contour and manufacturing method thereof

An edge profile and asymmetrical technology, applied in semiconductor/solid-state device manufacturing, semiconductor/solid-state device parts, semiconductor devices, etc., can solve the problems of reduced process pass rate, particle pollution, induced process defects, etc., to reduce particle pollution , The effect of improving the qualification rate of the process

Active Publication Date: 2008-07-23
宁夏中欣晶圆半导体科技有限公司
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the subsequent wafer processing process, the backside of the silicon wafer will be thinned, as shown in the figure below the arrow in Figure 1, Figure 2, and Figure 3. The final thickness t is usually about 100 μm, and it is manufactured by traditional chamfering methods. After thinning the s

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  • Silicon slice with asymmetry edge contour and manufacturing method thereof
  • Silicon slice with asymmetry edge contour and manufacturing method thereof
  • Silicon slice with asymmetry edge contour and manufacturing method thereof

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Embodiment Construction

[0022] A preferred embodiment of the present invention is described as follows with reference to the accompanying drawings: Referring to FIG. 4 , the silicon wafer with an asymmetrical edge profile of the present invention has an asymmetrical shape consisting of arcs and straight lines. The upper surface 1, the lower surface 7, and the tip face 4 of the silicon wafer are linear parts, the upper surface 1 is connected with the tip face 4 of the silicon wafer through the arc EP1 3, and the tip face 4 of the silicon wafer is connected through the arc EP2 5 and the hypotenuse 6 is connected to the lower surface 7 . The top end surface 4 of the silicon wafer is tangent to the arcs EP1 3 and EP2 5 , the arc EP1 3 is intersected with the upper surface 1 , and the arc EP2 5 is tangent to the hypotenuse 6 .

[0023] Referring to Fig. 4 and Fig. 5, the nouns represented by the symbols in the figures are: "T" represents the thickness of the semiconductor silicon wafer after polishing. "...

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Abstract

The invention relates to a silicon chip with asymmetry edge profile and a manufacturing method. The edge profile of the silicon chip comprises a profile from the upper surface of the silicon chip to the lower surface of the silicon chip via twisting the front end surface of the silicon chip. The front end surface of the silicon chip is a straight line, the transitional edge profile between the upper surface of the silicon chip and the front end surface of the silicon chip is a passage of circular arc EP1, the circular arc EP1 is tangent with the front end surface of the silicon chip and is intersecting with the upper surface of the silicon chip. The transitional edge profile between the lower surface of the silicon chip and the front end surface of the silicon chip are a long sloping side and a passage of circular arc EP2, the long sloping side and the lower surface of the silicon chip are with alpha angle, the circular arc EP2 is respectively tangent with the long sloping side and the front end surface of the silicon chip. The steps of the manufacturing method of the silicon chip comprise cutting film, chamfering hob and reserving polishing surplus on the upper surface, grinding the upper and lower surface, conducting etching treatment and polishing the upper surface to remove the reserved polishing surplus. After thinning process in the next phase, the edge of the silicon chip does not form an acute angle, the probability of damaging the edge is reduced and the percent of pass of the finished product is increased.

Description

technical field [0001] The invention relates to a silicon chip with an asymmetric edge profile and a manufacturing method thereof, belonging to a semiconductor device manufacturing method using a silicon chip as a substrate in a mass production process. Background technique [0002] Using the traditional substrate silicon wafer manufacturing method, the silicon wafer needs to go through the following steps: slicing, chamfering, grinding, etching, and polishing on one or both sides. There are two types of chamfered silicon chip edge profiles, T-shaped and R-shaped (as shown in Figure 1 and Figure 2), both of which are symmetrical profiles, that is, the front and back surfaces of the silicon chip have the same edge profile. In the subsequent wafer processing process, the backside of the silicon wafer will be thinned, as shown in the figure below the arrow in Figure 1, Figure 2, and Figure 3. The final thickness t is usually about 100 μm, and it is manufactured by traditional c...

Claims

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Application Information

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IPC IPC(8): H01L23/00H01L21/302
Inventor 洪漪
Owner 宁夏中欣晶圆半导体科技有限公司
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