System and method for testing jiggle contact resistance

Abstract

The invention discloses a system and a method of testing a micromotion contact resistance. The system comprises a microchecker unit, a micromotion contact resistance test unit, a data acquisition unit and a computer unit. The method has the following steps that a test micromotion contact resistance system is started for initialization, and the micromotion and control command parameter information is set in the computer unit and sent to the microchecker unit; the microchecker unit carries out micromotion according to the received micromotion and control command parameter information and adjusts the micromotion amplitude according to the self-formed micromotion feedback information; the micromotion contact resistance test unit carries out contact resistance test for a connector contact pair in micromotion, and the data acquisition unit samples the contact voltage signal and outputs the sampled signal to the computer unit for data storage, processing and graphic display. The system and the method of measuring a micromotion contact resistance are capable of regulating and controlling test parameters according to requirements, widening the test channel of the micromotion contact resistance and improving the accuracy of micromotion contact resistance test.

Description

technical field [0001] The invention relates to a contact resistance testing technology of a low-voltage electrical appliance connector, in particular to a system and method for testing fretting contact resistance. Background technique [0002] In the communication system or power transmission system, there are a large number of electrical connection links. Due to the influence of external environmental factors, such as impact, collision, vibration, cold and heat cycle, etc., the electrical contact contacts of the connector may change relatively slightly. (fretting), the surface of the connector is worn, and the debris generated by the wear is exposed to the atmosphere, oxidized to form an insulating oxide film layer, and remains on the electrical contact surface, thereby affecting the electrical contact performance of the connector and causing the contact of the connector The resistance value increases or even breaks the circuit. The phenomenon of contact failure caused by ...

AI Technical Summary

Problems solved by technology

[0017] 1. The micro-motion amplitude of the micro-motion table fluctuates greatly, and the control is not precise

As in the above system, the set micro-motion amplitude is 30 microns, but in actual operation, the micro-motion amplitude of the micro-motion table fluctuates within the range of 30-120 microns, and the control is not accurate

[0018] 2. The micro-motion amplitude of the micro-motion table is not adjustable

The existing fretting contact resistance test system can only perform a single fretting with a certain amplitude, but in practical applications, it is necessary to perform fretting contact resistance testing and analysis on fretting with different amplitudes

[0019] 3. The accuracy of fretting contact resistance test is low

Since the micro-motion frequency, micro-motion amplitude, contact pressure, contact current, temperature and humidity in the actual operating environment will affect the test accuracy of the micro-motion contact resistance, the normal contact resistance of the connector is generally only a few milliohms, while Connectors, especially those in mobile electronic devices, have a working current of tens of milliamps. Under the working current, the contact voltage drop of the connector is only tens of microvolts. Moreover, due to the interference of the environment and noise, it is easy to use Voltmeter reading fluctuates, causing inaccurate measurements

[0020] 4. The number of channels tested is limited

The existing fretting contact resistance test system has only one channel, and can only perform accelerated fretting simulation experiments on one connector contact pair, which is low in experimental efficiency and is not conducive to real-time observation and analysis of comparative tests at the same time

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