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Probe clamp for moving atomic force microscope probe

An atomic force microscope and probe technology, which is applied in the field of probe pliers, can solve problems such as damaged probes, and achieve the effects of low production cost, high success rate of movement, and simple movement operation

Inactive Publication Date: 2008-08-27
JIANGXI NORMAL UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the operation is not done properly, some or all of the probes on the entire silicon crystal will be damaged, so it must be handled carefully by skilled engineers

Method used

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  • Probe clamp for moving atomic force microscope probe

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] In Example 1, remove the probe 3 from the processed silicon crystal and put it in the probe box: first align the probe clamp with the probe carrier and gently press it down until the two arms of the fixed probe 3 are under force Then, gently lift the probe clamp upward, and the probe clamp moves the probe 3 stuck to the front end to the probe box together; after gently lowering the probe 3, press down again, and then lift the probe clamp. The probe 3 sticks to the viscous material on the bottom surface 4 of the probe box.

Embodiment 2

[0023] Example 2, to move the probe 3 from one probe box to another probe box: first align the probe clamp with the probe 3 carrier and gently press it down; then gently lift the probe clamp upwards. The needle pliers can’t stick the probe 3, you can use tweezers to gently pry the probe 3 carrier to move it away; put down the probe 3 gently and then press down, press the probe carrier with the tweezers, and then lift the probe clamp, the probe 3 is stuck to the viscous material on the bottom surface of the probe box. This operation is best used with tweezers.

Embodiment 3

[0024] Example 3, install the probe 3 from the probe box to the probe holder of the atomic force microscope: first align the probe clamp with the probe carrier and gently press it down; then gently lift the probe clamp upward, if the probe The pliers can not stick the probe 3, you can use tweezers to gently pry the probe carrier to make it leave; gently put the probe 3 on the holder's fixed bracket, press the probe 3 to separate it from the probe pliers. Generally, tweezers can be used to adjust the position of the probe 3 slightly.

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PUM

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Abstract

The present invention discloses a probe clamp for moving an atomic force microscope probe, comprising a probe rod and a probe bonding head. The probe bonding head is positioned at the front end of the probe rod, wherein the probe bonding head consists of solidified adhesive material. The adhesive material is produced by naturally curing a uniform mixture which is formed by, by weight ratio, 10 parts of dimethyl silane at the standard of 184 type SILICONE ELASTOMER KIT and 2 to 4 parts of silicone resin curing agent with a name of Tetramethyl tetravinyl cyclotetrasi loxane in the air under room temperature. The probe clamp is simple in structure, low in production cost, and the cost is much lower than the cost of the special forceps which are used for withdrawing or placing the probe. The operation of moving the probe is simple and the moving success ratio is exceedingly high.

Description

Technical field [0001] The invention relates to a probe clamp for moving probes, in particular to a probe clamp for moving probes of an atomic force microscope. Background technique [0002] The atomic force microscope is one of the third generation of new microscopes developed after the optical microscope and the electron microscope. It relies on tiny probes to detect the shape of the measured object and its electrical, magnetic, viscoelastic, hardness and other properties. Due to its ultra-high resolution, no need for substrate conductivity, and ability to operate in liquid and atmospheric environments, atomic force microscopes have been widely used in various fields. The probe is a key component in the application of atomic force microscopy, and its quality directly affects the imaging quality and data accuracy. In experiments, tweezers are usually used to move the probe. It is required that the experimenter must be very careful to operate, if improper operation will damage th...

Claims

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Application Information

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IPC IPC(8): G12B21/00
Inventor 宋永海汪莉
Owner JIANGXI NORMAL UNIVERSITY