MCM / HIC circuit total dose irradiation testing method based on low energy X ray

Abstract

The invention discloses a total dose irradiation test method for an MCM / HIC circuit based on low-energy X-ray. The method comprises the following steps: firstly analyzing the MCM / HIC circuit to determine irradiation sensitive components in the MCM / HIC circuit, then irradiating one or a plurality of sensitive components by an irradiation fixture in the operating state of the MCM / HIC circuit to determine the radiation resistance of the sensitive components in the operating state of the circuit, and finally performing total dose irradiation on the whole MCM / HIC circuit and testing electrical parameters of the MCM / HIC circuit in an on-line monitoring manner. The technology of the invention can be used for achieving anti-radiation total dose level test evaluation on a multi-chip hybrid integrated circuit, thus evaluating the radiation resistance of the whole circuit, and studying the radiation resistance of the sensitive components in the circuit, which is good for the partial anti-radiation reinforcement design of a circuit.

Description

technical field [0001] The invention relates to a low-energy X-ray based MCM / HIC circuit total dose irradiation test method, through which the X-ray total dose is irradiated to the entire MCM / HIC circuit and internal sensitive components to determine the MCM / HIC Radiation resistance of circuits and their internal sensitive components. Background technique [0002] Hybrid integrated circuit (HIC) and multi-chip module (MCM) are a kind of circuit packaging module between PC circuit board and single chip circuit. MCM / HIC can not only complete more complex functions than single chip, And the dissipated power it bears is much larger than that of a single-chip circuit. Because the MCM / HIC circuit has the characteristics of high packaging density, complex functions and good heat dissipation, it is especially suitable for application in aerospace. HIC / MCM circuits used in space and nuclear power systems may be exposed to various levels of ionizing radiation doses, so in the proces...

AI Technical Summary

Problems solved by technology

[0004]The test method used in this standard can only confirm that the entire MCM / HIC circuit reaches a certain level of radiation resistance, and cannot know the resistance of sensitive components inside the MCM / HIC circuit. radiation performance

This method is feasible for evaluating the anti-radiation ability of the circuit, but if it is necessary to evaluate the effect of the anti-radiation reinforcement design of the circuit, or to study the radiation-sensitive components in the MCM / HIC circuit, for targeted radiation To provide a basis for reinforcement and improvement, this method is a bit rough

Images