Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

MCM / HIC circuit total dose irradiation testing method based on low energy X ray

A technology of total dose irradiation and test method, which is applied in the field of total dose irradiation test of MCM/HIC circuits based on low-energy X-rays, can solve the problems of not being able to know the radiation resistance and roughness of sensitive components, and reduce the test time , the effect of low dose rate

Inactive Publication Date: 2009-04-22
信息产业部电子第五研究所
View PDF0 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004]The test method used in this standard can only confirm that the entire MCM / HIC circuit reaches a certain level of radiation resistance, and cannot know the resistance of sensitive components inside the MCM / HIC circuit. radiation performance
This method is feasible for evaluating the anti-radiation ability of the circuit, but if it is necessary to evaluate the effect of the anti-radiation reinforcement design of the circuit, or to study the radiation-sensitive components in the MCM / HIC circuit, for targeted radiation To provide a basis for reinforcement and improvement, this method is a bit rough

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • MCM / HIC circuit total dose irradiation testing method based on low energy X ray
  • MCM / HIC circuit total dose irradiation testing method based on low energy X ray
  • MCM / HIC circuit total dose irradiation testing method based on low energy X ray

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] Below in conjunction with accompanying drawing, the present invention is further elaborated:

[0014] Such as figure 1 As shown, the specific steps of the MCM / HIC circuit total dose irradiation test method are as follows:

[0015] Step 1: MCM / HIC circuit analysis. Use PSPICE software to simulate the circuit to determine the radiation-sensitive components in the MCM / HIC circuit, such as optoelectronic devices and microcircuits.

[0016] Step 2: Sampling and disposal of samples. Because of the limited penetration ability of photons, the ionizing radiation effect test is only for unpackaged devices (such as wafer level) or packaged devices with lids removed. In addition, only multi-chip devices that meet the electrical parameter specifications specified in the test plan can be submitted for radiation testing. Each device should be individually numbered so that it can be identified before and after irradiation. For ESD-sensitive devices, ESD protection technology shou...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a total dose irradiation test method for an MCM / HIC circuit based on low-energy X-ray. The method comprises the following steps: firstly analyzing the MCM / HIC circuit to determine irradiation sensitive components in the MCM / HIC circuit, then irradiating one or a plurality of sensitive components by an irradiation fixture in the operating state of the MCM / HIC circuit to determine the radiation resistance of the sensitive components in the operating state of the circuit, and finally performing total dose irradiation on the whole MCM / HIC circuit and testing electrical parameters of the MCM / HIC circuit in an on-line monitoring manner. The technology of the invention can be used for achieving anti-radiation total dose level test evaluation on a multi-chip hybrid integrated circuit, thus evaluating the radiation resistance of the whole circuit, and studying the radiation resistance of the sensitive components in the circuit, which is good for the partial anti-radiation reinforcement design of a circuit.

Description

technical field [0001] The invention relates to a low-energy X-ray based MCM / HIC circuit total dose irradiation test method, through which the X-ray total dose is irradiated to the entire MCM / HIC circuit and internal sensitive components to determine the MCM / HIC Radiation resistance of circuits and their internal sensitive components. Background technique [0002] Hybrid integrated circuit (HIC) and multi-chip module (MCM) are a kind of circuit packaging module between PC circuit board and single chip circuit. MCM / HIC can not only complete more complex functions than single chip, And the dissipated power it bears is much larger than that of a single-chip circuit. Because the MCM / HIC circuit has the characteristics of high packaging density, complex functions and good heat dissipation, it is especially suitable for application in aerospace. HIC / MCM circuits used in space and nuclear power systems may be exposed to various levels of ionizing radiation doses, so in the proces...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/00
Inventor 罗宏伟何玉娟恩云飞师谦肖庆中
Owner 信息产业部电子第五研究所
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com