The invention discloses a system and method for testing light-electricity-heat integration of an LED device. The system comprises a computer (010), an ARM control circuit (020), an optic testing system (030), a transient thermal testing system (040) and a thermostatic bath (050). The computer (010) is respectively connected with the ARM control circuit (020) and the transient thermal testing system (040) through signal wires (070), the ARM control circuit (020) is respectively connected with the transient thermal testing system (040) and the optic testing system (030) through signal wires (070), and the thermostatic bath (050) is respectively connected with the optic testing system (030) and the transient thermal testing system (040) through signal wires (070). According to the system for testing light-electricity-heat integration of the LED device, optical parameters, electricity parameters and thermal parameters of the LED device are measured at the same time, the luminous power in the measured optical parameters can be adopted, so that electric power exerted by a transient heat resistance testing system on the LED device is corrected, the actual wasted power of the LED device is obtained, and therefore an integration test of light, electricity and heat of the LED device is achieved, and the accuracy of the transient thermal resistance test of the LED device is improved.