Feedback type keystroke life test method and device

A life test device and feedback-type technology, which is applied in the button life evaluation test. In the field of feedback-type button life test device, it can solve the problems of subjective judgment in the test process and conclusion, simple key life test data, and lack of feedback control capabilities. , to achieve the effect of simple structure, simple test data and low cost

Active Publication Date: 2009-11-11
QIMING INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention discloses a feedback type button life test device and a test method to solve the problem that the button life test in the prior art cannot measure the abnormality of the button in th...

Method used

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  • Feedback type keystroke life test method and device
  • Feedback type keystroke life test method and device

Examples

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Embodiment Construction

[0019] The following is an embodiment of the present invention.

[0020] like figure 1 As shown, a feedback type button life test device of the present invention includes a hitting pressure feedback circuit 1, a contact resistance feedback circuit 2, an electric execution unit 3 for hitting action, a single-chip microcomputer control system ECU 4, a data storage circuit 5, a man-machine The interactive unit 6; the hitting pressure feedback circuit 1 and the contact resistance feedback circuit 2 are respectively connected to the single-chip control system ECU 4 with electrical signals, and the measured button resistance and pressure signals are transmitted to the single-chip control system ECU 4 to form a feedback signal input circuit; the single-chip The control system ECU 4 is electrically connected with the electrical execution unit 3 of the hitting action to form a feedback signal output circuit to realize the electrical adjustment of the hitting force of the tested key; th...

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Abstract

The invention discloses a feedback type keystroke life test device and a method. The device comprises an ECU and an electric execution unit of impact action, and is characterized by also comprising an impact pressure feedback circuit provided with a pressure sensor and a contact resistance feedback circuit. The ECU, the impact pressure feedback circuit, the contact resistance feedback circuit and a connection end of a tested keystroke constitute an input feedback control circuit, and the EUC, the electric execution unit and the connection end of the tested keystroke constitute an output feedback control circuit. The device is small in volume, simple in structure and low in cost, overcomes the defects of simple test data, no feedback and subjective judgment and the like of the existing test device, and has fairly high stability, repeatability and reproducibility.

Description

technical field [0001] The invention belongs to the technical field of detection of electronic components, and relates to a key life test device and a test method, in particular to a feedback type key life test device and a test method, and is especially suitable for key life evaluation tests. Background technique [0002] The key life test device is an essential equipment for key quality monitoring. The tested key should not have structural defects and electrical performance degradation during and after the key life test. [0003] Existing known button life test devices use rubber contacts to simulate fingers hitting the tested button to detect the click life of switch devices such as buttons, switches, membrane switches, keyboard buttons, and touch panels. The key life test device only maintains a continuous and stable hitting action, and cannot record the number of effective hitting times when the key is abnormal, and cannot record the pressure value of the tested key and...

Claims

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Application Information

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IPC IPC(8): G01R31/327G01R27/02G01M19/00G01L5/00G01M99/00
Inventor 边增远王鑫陈兆莹韩润哲董杨
Owner QIMING INFORMATION TECH
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