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Dimension measuring device for optical standing wave nano-particles

A nanoparticle and measuring device technology, applied in the field of optics, can solve the problems such as the inability to eliminate the influence of the measurement accuracy of particle material characteristics, the detection accuracy is greatly affected by the beam characteristic parameters, the measurement method and the system composition are complex, etc., so as to eliminate the beam parameter measurement. Influence, low measurement environment requirements, effect of eliminating influence on measurement

Inactive Publication Date: 2009-12-16
HANGZHOU DIANZI UNIV
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Problems solved by technology

Although this method has certain advantages, there are still some deficiencies in principle. The light beam is a far-field light traveling wave light beam, and the detection accuracy is greatly affected by the characteristic parameters of the light beam, which affects the measurement accuracy; the intensity of scattered light and the fluctuation of light intensity are related to the characteristics of particle materials (such as Permittivity, permeability, conductivity and other parameters) are directly related, and it is impossible to eliminate the influence of particle material characteristics on the measurement accuracy of the light scattering method in the prior art, and the measurement method and system are complicated.

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  • Dimension measuring device for optical standing wave nano-particles

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Embodiment Construction

[0021] The present invention will be further described in detail below in conjunction with the examples.

[0022] Such as figure 1 As shown, an optical standing wave nanoparticle size measurement device includes a laser light source 1, a beam expander collimator 2, an isosceles prism 3, a first reflector 4, a first focusing lens 5, a phase adjuster 9, a second reflector Mirror 10, second focusing lens 11, plano-convex lens 6, converging objective lens 7, photoelectric sensor 8.

[0023] The beam expander collimator 2 and the isosceles prism 3 are sequentially arranged on the exit beam optical path of the laser light source 1, the entrance pupil of the beam expander collimator 2 corresponds to the laser light source 1, and the exit pupil of the beam expander collimator 2 corresponds to the isosceles The top edge of the triangular prism 3 is set, and the output beam of the laser light source 1 passes through the beam expander and collimator 2 to form an expanded and collimated ...

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Abstract

The invention relates to a dimension measuring device for optical standing wave nano-particles. The prior art has low measurement accuracy and has high requirement on measurement environment. The device comprises a laser light source, a beam expanding collimator, an isosceles prism, a first reflecting mirror, a second reflecting mirror, a first focusing lens, a second focusing lens, a phase regulator, a plano-convex lens, a convergence objective and a photoelectric sensor. Two beams, which are reflected by two isosceles surfaces of the isosceles prism, of a laser beam pass through the reflecting mirrors and the focusing lenses respectively and then are intersected to form an interference area; a plane of the plano-convex lens arranged at the intersection of the beams is positioned in the interference area, and nano-particles are arranged on the plane; the phase of one beam is changed through the phase regulator to cause interference fringes to move, and the scattering light intensity of the nano-particles synchronously has intensity change; and the photoelectric sensor detects the scattering light intensity of the nono-particles, and sizes of the nano-particles are measured by calculating light intensity contrast. The device has the characteristics of no interference of granular materials, high measurement accuracy, low requirement on measurement environment, wide application and the like.

Description

technical field [0001] The invention belongs to the field of optical technology, and relates to a measuring device, in particular to an optical standing wave nano particle size measuring device, which is mainly used for measuring the size of nano tiny particles. technical background [0002] Nanotechnology has aroused people's widespread attention. Nanotechnology has greatly promoted the development of many fields such as industry and agriculture, medical and health care, life sciences, and environmental safety, and has become one of the main driving forces for social development. At present, the nanomaterials industry is booming and has initially formed a large-scale industry. The particle size of nanomaterials has an important impact on nanomaterials. How to quickly and accurately measure the particle size of nanomaterials has always been the most concerned issue in nanomaterials research. It has been widely valued by people and has gradually developed into a modern measur...

Claims

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Application Information

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IPC IPC(8): G01B11/00G02B27/09
Inventor 高秀敏
Owner HANGZHOU DIANZI UNIV
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