Self-fitting digital temperature compensation crystal oscillistor and system and realization method thereof

Abstract

The invention discloses a self-fitting digital temperature compensation crystal oscillistor and a system and a realization method thereof, which uses resources thereof, finishes the temperature compensation fitting process in an autonomous manner, thus ensuring the consistency of the product inner environment and production environment, improving the accuracy of the temperature compensation data and ensuring the frequency temperature stability precision. The fitting test process has the advantages of avoiding the whole-process control from computers, improving the production efficiency in each unit time and preventing the risks caused by abnormal peripheral or manual misoperation. In the invention, the temperature property index of the pilot production product is -40 DEG C to +85 DEG C, has better property with all being less than plus or minus 0.05ppm, exceeds 10-20 times than the like products, is higher than the frequency temperature stability index of three-level clock constant-temperature crystal oscillistor, and ensures the frequency temperature stability precision to get the optimal effect.

Description

technical field [0001] The invention relates to a digital temperature-compensated crystal oscillator and its technology, in particular to a digital temperature-compensated crystal oscillator capable of independently completing a temperature-compensated fitting process, a system and an implementation method thereof. Background technique [0002] Temperature-compensated crystal oscillators are widely used in military and civilian communication stations, satellite communications, GPS, wireless communications and other fields due to their small size, low power consumption, light weight, and fast start-up characteristics. At present, the fitting test of digital temperature-compensated crystal oscillators in the industry is mostly controlled by a computer. The data of the fitting process is all calculated, processed and stored by the computer. After the test is completed, the fitting compensation data needs to be downloaded to the digital temperature-compensated crystal oscillator....

AI Technical Summary

Problems solved by technology

[0003] (1) Since the computer needs to be fully involved in each digital temperature-compensated crystal oscillator during the temperature fitting process, it is impossible for the computer to accurately collect each digital temperature in real time due to the limitation of simple communication methods (such as RS232) during mass production. Compensation of the real temperature inside the crystal oscillator causes a large deviation between the temperature compensation data obtained by fitting and the actual compensation data of the digital temperature compensation crystal oscillator, so that the accuracy of frequency temperature stability cannot reach the best

As stated in the utility model patent "A Microcomputer Temperature Compensated Crystal Oscillator" with the patent number 01273470.5, the temperature characteristic index among the main performance parameters of the 20 samples produced in batch trial production can only reach "frequency temperature characteristic: -40℃~+85℃ is less than ±1ppm”;

[0004] (2) Temperature fitting test All data in the production process are calculated and processed by the computer, so the computer needs to be involved in the fitting of each digital temperature-compensated crystal oscillator throughout the process, and each digital temperature-compensated crystal oscillator is polled by the computer Fitting greatly limits the production efficiency per unit time;

[0005] (3) Since the temperature fitting compensation data is directly saved to the computer during the temperature fitting process, after the temperature fitting test is completed, it is necessary to download the temperature fitting compensation data saved by the computer to the digital temperature compensation crystal oscillator. In the memory of the MCU, the fitting time is generally about 4 hours, so because the data recording time is far from the time saved in the memory of the MCU inside the digital temperature-compensated crystal oscillator, if the temperature fitting test process or fitting compensation data Any abnormality in any part of the entire test system during the download process will make the production process more cumbersome, and increase the risk of manual operation errors if necessary

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