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Novel ion detection system applied to single-ion microbeam device and based on spectroscope

A detection system and spectroscope technology, applied in the field of ion detection and optics, can solve the problem of not being able to observe the real-time changes of the sample, and achieve the effect of stable and reliable work and simple process requirements.

Inactive Publication Date: 2012-07-04
INST OF PLASMA PHYSICS CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to provide a novel ion detection system based on a beam splitter and applied to a single ion micro-beam device. Aiming at the problems of the prior art, a kind of ion detection based on a beam splitter is proposed on the basis of a part of the pre-detection mode method to solve the problem that the current micro-beam cannot observe the real-time changes of the sample while irradiating the sample, and it can also irradiate transparent thick samples, which expands the application range of the micro-beam and improves the experimental efficiency

Method used

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  • Novel ion detection system applied to single-ion microbeam device and based on spectroscope
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  • Novel ion detection system applied to single-ion microbeam device and based on spectroscope

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Embodiment Construction

[0017] Modification of microscope light path:

[0018] Such as figure 2shown. The first C-mount adapter (c-mount adapter) 4 of the microscope is refitted, at first a circular hole is processed in the middle of the first C-mount adapter 4, the diameter is the same as the adapter diameter and processed into a standard interface according to the C-mount standard , fix the beam splitter 3 in the punched round hole, and keep the angle between the normal line of the beam splitter and the axis of the first C-type interface adapter 4 at 45°. Then install the optical filter 1 above the installed beam splitter 3 in the first C-type interface adapter 4, install the optical filter 2 in the right part of the second C-type interface adapter 5 and put the second C-type interface adapter 5 is installed on the first Type-C interface adapter 4 . Finally, the CCD camera is installed on the first C-type interface adapter 4, and the photomultiplier tube is installed on the right end of the sec...

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Abstract

The invention relates to a novel ion detection system applied to a single-ion microbeam device and based on a spectroscope. The novel ion detection system comprises a CCD camera, a fluorescent microscope and a single-ion microbeam, wherein a plastic scintillator is arranged below the fluorescent microscope; a sample to be measured is arranged between the objective lens of the fluorescent microscope and the plastic scintillator; an exist port of the single-ion microbeam is below the plastic scintillator; a first light filter and the spectroscope are arranged in sequence between the CCD camera and the objective lens of the fluorescent microscope; the transmission surface of the spectroscope faces the CCD camera; the first light filter is positioned between the spectroscope and the CCD camera; a photomultiplier is arranged at one side of the reflecting surface of the spectroscope; and a second light filter is arranged between the spectroscope and the photomultiplier. The novel ion detection system does not need to transform the microbeam injection system part and the internal light path of the microscope, only changes the external light path, and has simple process requirement, and stable and reliable work. The novel ion detection system is applied to the single-ion microbeam device and achieves the on-line detection function of a microbeam platform.

Description

technical field [0001] The invention relates to the fields of ion detection and optics, in particular to a novel ion detection system based on a beam splitter and applied to a single ion micro-beam device. Background technique [0002] With the continuous accumulation of human knowledge and the further improvement of the ability to understand nature, people are paying more and more attention to their living environment, especially the impact of ionizing radiation on health. In order to explore the biological damage caused by ionizing radiation, especially the internal mechanism of the interaction between low-dose radiation and living cells or tissues, researchers urgently need a device that can accurately position and project quantitative particles, that is, single-ion microbeams. [0003] Single-ion microbeam is an irradiation technology platform that can accurately generate a single ion with a positioning accuracy of micron scale. It can accurately project a certain number...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/64G01T1/203G02B21/36
Inventor 许永建黄青余增亮陈连运李军詹福如吴李君吴跃进
Owner INST OF PLASMA PHYSICS CHINESE ACAD OF SCI
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