Programmable integrated circuit automatic testing and sorting system

Abstract

A programmable integrated circuit automatic testing and sorting system consists of a principal computer and a subordinate computer; the principal computer comprises a PC which is used for executing start and stop of the test, providing operating interface of editing test template for a user, monitoring working condition of the system, and displaying, analyzing and storing return parameters of component test; the subordinate computer comprises a tester which carries with a plurality of channel plates, the output pin of each channel plate is connected to a pin of the integrated circuit to be tested by a mechanical arm, the mechanical arm is used for grabbing and fixing the integrated circuit to be tested, and putting the components into a designated box according to sorting result; the principal computer downloads the test template edited according to protocol to the tester via a serial port, the tester resolves out atomic operation sequence and sorting condition sequence according to the protocol after receiving the test template so as to conduct the test. The system is applicable to various integrated circuit testing and sorting by flexible programming, and improves test efficiency greatly while reducing test cost.

Description

technical field [0001] The invention relates to an integrated circuit automatic testing and classification system, in particular to a programmable Hall device automatic testing and classification system, which is suitable for integrated circuit manufacturers and can be installed on the integrated circuit production line to automatically test and classify devices Package. Background technique [0002] Before leaving the factory, each integrated circuit needs to test the specified parameters to eliminate defective products, and classify qualified products according to their performance indicators. Existing integrated circuit testers usually can only test several fixed parameters according to the solidified program, so with the continuous introduction of new integrated circuits, manufacturers need to continuously purchase new integrated circuit testers to meet new testing requirements . At the same time, each test of this type of instrument can only complete the test of one o...

AI Technical Summary

Problems solved by technology

Existing integrated circuit testers usually can only test several fixed parameters according to the solidified program, so with the continuous introduction of new integrated circuits, manufacturers need to continuously purchase new integrated circuit testers to meet new testing requirements

At the same time, each test of this type of instrument can only complete the test of one or several devices. After the test, the operator needs to manually classify and place the devices according to the test results, which makes the test efficiency very low. At the same time, human-introduced errors it is inevitable

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