Method for testing service life of NMOS hot carrier injection
A hot carrier and lifetime technology, applied in the direction of single semiconductor device testing, semiconductor/solid-state device testing/measurement, etc., can solve the problems of scrapped wafers and increased costs, and achieve cost saving, saving capacity and material loss, and saving The effect of test time
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[0017] The specific embodiments of the present invention will be described in more detail below in conjunction with the accompanying drawings.
[0018] A method for testing the hot carrier injection lifetime of an NMOS device includes the following steps:
[0019] Step 1. The test system applies test voltage stress to the drain of the device under test, and the value of the test voltage is between 60% and 70% of the punch-through voltage. The test system can be determined as required. In this embodiment, the Agilent 4070 test system is used in the RMB (Agilent assembly language Rocky Mountain Basic, applied to the Agilent test system) environment; the stress voltage applied to the drain is the most important One of the parameters.
[0020] Step 2. The test system uses the maximum substrate current method to perform the test. The gate voltage corresponding to the maximum substrate current when the voltage stress is applied to the drain is the gate voltage stress, and the gate voltage...
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