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Accessorized high magnification collimating eyepiece

A straight eyepiece, high-magnification technology, applied in the field of autocollimation measurement devices, can solve the problems of low eyepiece magnification and increased alignment error, etc., and achieve the effect of compact structure, high contrast, and less eye fatigue

Active Publication Date: 2010-06-16
BEIJING AEROSPACE INST FOR METROLOGY & MEASUREMENT TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The Swiss company Leica is an important manufacturer of total stations and electronic theodolites. The accessory collimating eyepieces produced are called "fast eyepieces". The magnification is low, only more than ten times, which increases the alignment error when measuring the self-calibration value

Method used

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  • Accessorized high magnification collimating eyepiece
  • Accessorized high magnification collimating eyepiece
  • Accessorized high magnification collimating eyepiece

Examples

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Embodiment Construction

[0015] The present invention is described in detail below in conjunction with accompanying drawing:

[0016] Attached, high-magnification collimating eyepiece, which includes an eyepiece group 5, in the direction of the optical path of the eyepiece group 5, a microscopic objective lens group 6 and a dichroic prism 11 are arranged in sequence, and the eyepiece group 5 and the microscope group 6 are both arranged in the housing 3 , the lower part of the dichroic prism 11 is glued to the illuminating prism 12, and the outside of the illuminating prism 12 is provided with a green light diode 8, which is connected to the switch 7. The microscope group 6 includes a microscopic objective lens 13, and both sides of the microscopic objective lens 13 are provided with meniscus lenses 14. A ground glass 9 and a cross diaphragm 10 are arranged between the green light diode 8 and the illumination prism 12 .

[0017] The light path diagram of the collimating eyepiece, such as figure 2 sh...

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Abstract

The invention belongs to an auto-collimation measuring device of a total station and an ordinary transit, in particular relating to a high magnification collimating eyepiece. The high magnification collimating eyepiece of the invention has the advantages that two meniscuslens eyelevel fields are added in a light path to obtain clear images, and a focusing wheel can be easily adjusted to a clear position. As a cross-shaped diaphragm is added, the background light is weakened obviously, thus eyestrain of operators can not be caused easily, and the contrast ratio is higher, and returning images can be easily found. The magnification is higher, when a 30-time eyepiece is used and a divided plate is in a single-double line structure, a two-image singlet line and a double-line are utilized for aligning, and the alignment error is 0.3''. When the divided plate is single line, as the alignment of the two black lines is in a disadvantageous alignment mode, the alignment error is 0.9''; the collimating eyepiece has small and exquisite structure, and can not damage the balance of a telescope to the horizontal axis of an instrument.

Description

technical field [0001] The invention belongs to a total station and a self-collimation measuring device of an ordinary theodolite, in particular to a high-magnification collimating eyepiece. Background technique [0002] Total stations and ordinary theodolites do not have collimation devices, so they cannot be used to make the optical axis of the telescope perpendicular to the mirror, that is, they cannot perform "self-collimation" measurements, which limits the scope of use of these instruments, especially in industrial The use of departments is greatly restricted, and there are two main solutions at present: [0003] 1. Modify the instrument. Change the structure of the telescope, increase the beam splitting prism, collimate the reticle and the light source, and convert the ordinary telescope of the instrument into a self-collimating telescope. The disadvantage of this scheme is that the refitting of precision instruments has to go through strict approval, and due to the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B25/02G01C1/00G01C1/02
Inventor 王震李政阳孙方金
Owner BEIJING AEROSPACE INST FOR METROLOGY & MEASUREMENT TECH
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