Laser probe micro-area component analyzer based on double laser light source

Abstract

The invention belongs to the technical field of laser probing, in particular to a laser probe micro-area component analyzer based on a double laser light source. The laser probe micro-area component analyzer comprises a fixed wavelength laser device, an attenuator, a beam expanding mirror and an aperture diaphragm; first semi-permeable half-mirrors are arranged on the same horizontal light path according to the structure; after a wavelength tunable laser device is reflected onto the first semi-permeable half-mirrors by a second totally reflecting mirror, the wavelength tunable laser device has the same light path with the laser beam of the fixed wavelength laser device; the fixed wavelength laser device and the wavelength tunable laser device can be arranged up and down or in parallel, and the starting sequence and the time delay thereof can be controlled by a digital delay generator; a fibre-optical probe receives laser, then the laser is transmitted to a grating spectrometer by the optical fibre, and the acquisition time of a plasma spectra reaching enhancement mode CCD is controlled by the digital delay generator. The laser probe machine stimulated by the double laser light sources has low detection limit, high element analysis precision and favourable element selectivity, is reliable and safe, and can be used for accurately determining the nature of microelements and trace elements of the micro-areas of various substances as well as carrying out accurate quantitative analysis.

Description

technical field [0001] The invention relates to a laser probe micro-area component analyzer using double laser light sources, which is mainly used for qualitative and precise quantitative analysis of material micro-area element components. Background technique [0002] Laser Induced Breakdown Spectroscopy (LIBS for short) technology is a new type of atomic spectrum analysis technology, which emits a spectrum by focusing a pulsed laser beam on the surface of a material to ablate it to form a plasma. Spectra to analyze the composition and content of its elements. Because of its unique multi-element synchronous real-time analysis capability, simple sample pretreatment requirements, and especially the ability to realize remote detection in the field, real-time online and high-risk environments, this technology has received great attention and has been accepted as soon as it appeared. Widely used in qualitative and quantitative analysis of various objects. At present, LIBS tech...

AI Technical Summary

Problems solved by technology

However, this laser probe micro-area composition analyzer still has the following shortcomings: first, the use of a single pulse laser cannot sufficiently resonate the plasma, that is, its secondary excitation effect on the plasma is not ideal; second, the use of The pulsed laser cannot completely and effectively suppress and exclude the interference of other elements, that is, it cannot well overcome the matrix effect and the interference of other elements, which will affect the selectivity and reliability of its element detection

Third, the use of single-pulse laser limits the reduction of the detection limit and the further improvement of detection accuracy, which will lead to large errors in the detection of trace and trace elements.

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