Compact transient microwave frequency photon measurement system
A microwave frequency and measurement system technology, applied in the field of microwave photonics, can solve the problems of low frequency of microwave source, difficulty in precise tuning, high phase noise, etc., achieve the effect of improving accuracy, avoiding measurement accuracy problems, and simplifying the system structure
Active Publication Date: 2011-10-19
山东中科际联光电集成技术研究院有限公司
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[0010] In view of this, the main purpose of the present invention is to provide a compact instantaneous microwave frequency photon measurement system to solve the problems of low frequency of microwave sources, high phase noise, difficulty in precise tuning and high insertion loss
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[0038] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.
[0039] see figure 1 as shown, figure 1 It is a schematic diagram of the compact instantaneous microwave frequency photon measurement provided by the present invention, including:
[0040] a receiving antenna 1;
[0041] A microwave power amplifier 2, the input end of the microwave power amplifier 2 is connected to the receiving line 1;
[0042] A high-speed direct modulation laser 3, the microwave signal output from the output end of the microwave power amplifier 2 is loaded on the high-speed direct modulation laser 3;
[0043] A circulator 4, the first port A of the circulator is connected to the high-speed direct modulation laser 3;
[0044] A tunable phase shift grating 5, one end of the tunable phase shift grating...
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The invention discloses a compact transient microwave frequency photon measurement system, which comprises a receiving antenna, a microwave power amplifier, a high-speed directly modulated laser, a circulator, a tunable phase-shifting grating, a tunable M-Z interferometer, a first high-speed photon detector, a second high-speed photon detector and a comparator. A microwave signal is loaded to thedirectly modulated laser of which the wavelength is tunable. By tuning the DC bias voltage of the laser, a positive / negative first-order sideband carrying the microwave frequency information is only generated on two sides of the carrier frequency, and the carrier power is suppressed by using the tunable phase-shifting grating. The filtering is carried out by a tunable M-Z filter, and the carrier wavelength is aligned with a peak value and a valley value at two output ports of the filter by tuning the arm length of the filter. Because the variation tendency of the power at the two output portsalong the microwave frequency is reverse, a comparison function is monotonously varied along the microwave frequency in a certain range and further the measurement of the transient microwave frequency can be realized.
Description
technical field [0001] The invention relates to the technical field of microwave photonics, and more specifically relates to a compact instantaneous microwave frequency photon measurement system, which uses a directly modulated distributed feedback laser and a Mach-Zehnder (M-Z) filter to realize instantaneous frequency measurement. Background technique [0002] The measurement of instantaneous microwave frequency (frequency band 300MHz-300GHz) is one of the key technologies of electronic countermeasures, such as the interception and eavesdropping of military information, radar jamming and anti-jamming capabilities, etc. However, microwave signal measurement based on electronic devices is limited by electronic bottleneck and instantaneous bandwidth, it is difficult to achieve wide frequency coverage and low error instantaneous measurement. The rise of microwave photonics has opened up a new way of thinking for instantaneous microwave frequency measurement. The instantaneous...
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IPC IPC(8): G01R23/02
Inventor 刘建国祝宁华王欣陈伟袁海庆
Owner 山东中科际联光电集成技术研究院有限公司