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Three-value FeRAM circuit

A ferroelectric memory and ferroelectric capacitor technology, applied in static memory, digital memory information, information storage, etc., can solve the problems of backward storage density and technological level, etc.

Inactive Publication Date: 2010-09-01
TSINGHUA UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Compared with FLASH, although ferroelectric memory has absolute advantages in terms of low power consumption, high writing speed and radiation resistance, it is one to two generations behind FLASH in terms of storage density.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] When performing a binary write operation, the timing is as follows Figure 4 As shown, the word line WL rises, the NMOS transistor is turned on, BL and BL / are the data to be written, the logic value "H" is written when the BL line is connected to a high level, and the logic value "H" is written when the BL line is connected to a low level. Logical value "L". Adding a pulse on PL, the polarization direction of the capacitor written in the logic value "H" and the capacitor written in the logic value "L" is always opposite. Finally, BL and BL / discharge, and the voltage returns to zero. The WL voltage returns to zero, the MOS tube is turned off, and the write operation ends.

Embodiment 2

[0034] When performing a binary read operation, the timing is as follows Figure 5 As shown, since the 2T2C memory cell structure is adopted, there is no need to generate a reference voltage separately, and the two input terminals of the sense amplifier SA0 are connected to BL and BL / respectively. The word line WL rises, and the NMOS transistor is turned on. At this time, although the remaining charges in the two ferroelectric capacitors are different, the BL and BL / voltage are 0, and the 1 unit and the 0 unit cannot be distinguished. Add a pulse to PL, and charge sharing will occur on the ferroelectric capacitor and the parasitic capacitor of BL. Since the values ​​stored in the two capacitors are opposite, different capacitance values ​​C 0 and C 1 , presenting different voltages V on BL and BL / 0 and V 1 . At this time, SEL0 rises to high level, the sense amplifier starts to work, and the voltage difference V 1 -V 0 amplified, the high voltage is pulled to V DD , l...

Embodiment 3

[0036]When performing a three-value write operation, the word line WL rises, the NMOS transistor is turned on, and the data to be written is on BL and BL / . When BL is connected to a high level, a logic value "H" is written, and when it is connected to a low level Then write a logic value "L", and write a logic value "M" when WRM~WRM / is high. The writing of "H" and "L" states is similar to writing "1" and "0" in traditional binary memory, as described above. For the intermediate state "M", a coercive voltage is required for biasing when writing. For the specific timing, see Image 6 .

[0037] When writing a ternary value, each bit line should need three control signals, that is, each pair of bit lines needs 6 control signals. The decoder can be implemented by a 3-8 decoder, and by properly selecting 6 bits in the output of the 3-8 decoder 8, the control of writing in the bit line can be realized.

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PUM

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Abstract

The invention designs a circuit for realizing a three-value FeRAM, belonging to the technical field of integrated circuit design and manufacturing. The circuit adopts a 2T2C unit structure of the traditional FeRAM; and on the basis of reserving the traditional read-write operation mode, the function for performing read-write operation by virtue of the 2T2C structure is added so as to realize 3-bit data storage by two ferroelectric capacitors. Under the same process conditions, the three-value FeRAM improves the memory density of a 1T1C FeRAM by 1.5 times.

Description

technical field [0001] The invention relates to the technical field of integrated circuit design, in particular to the circuit design of ferroelectric memory ternary storage. Background technique [0002] Ferroelectric memory is a new type of memory device manufactured using the hysteresis characteristics of ferroelectric capacitance. The ferroelectric memory currently on the market realizes the storage function by defining the positive and negative polarized values ​​of the binary information "0" and "1" on the hysteresis curve. Therefore, the storage density of the ferroelectric memory adopting the 1T1C storage unit structure is 1 bit / unit, while the storage density of the ferroelectric memory adopting the 2T2C storage unit structure is 0.5 bit / unit. [0003] Compared with FLASH, although ferroelectric memory has absolute advantages in terms of low power consumption, high writing speed and radiation resistance, it is one to two generations behind FLASH in terms of storage...

Claims

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Application Information

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IPC IPC(8): G11C11/22G11C7/06G11C7/22
Inventor 贾泽吴昊张弓任天令
Owner TSINGHUA UNIV
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