Method for separating base plate and semiconductor layer

A semiconductor and substrate technology, applied in the field of separating the substrate and the semiconductor layer, can solve the problems of poor quality, high lattice mismatch, affecting the luminous efficiency, etc., to achieve increased luminous efficiency, simple manufacturing process steps and reduced technical costs Effect

Inactive Publication Date: 2010-10-20
ZHANJING TECH SHENZHEN +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Although the sapphire substrate 602 can be directly removed from the CrN layer 604 by wet etching, the lattice mismatch between the CrN layer 604 and the GaN laye

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  • Method for separating base plate and semiconductor layer
  • Method for separating base plate and semiconductor layer
  • Method for separating base plate and semiconductor layer

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[0061] The direction discussed in the present invention is a method of separating the substrate and the semiconductor layer. In order to thoroughly understand the present invention, detailed steps and their composition will be proposed in the following description. Obviously, the implementation of the present invention is not limited to the specific details well known to those skilled in the semiconductor optoelectronic manufacturing process. On the other hand, well-known components or steps are not described in details to avoid unnecessary limitation of the present invention. The preferred embodiments of the present invention will be described in detail as follows. However, in addition to these detailed descriptions, the present invention can also be widely implemented in other embodiments, and the scope of the present invention is not limited, and the scope of the claims shall prevail. .

[0062] An object of the present invention is to separate the substrate and the semicond...

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Abstract

The invention relates to a method for separating a base plate and a semiconductor layer. The method is characterized in that a pattern silicon dioxide layer is formed between a temporary base plate and the semiconductor layer; then, the temporary base plate is separated from the pattern silicon dioxide layer by a secondary wet type etching way. The temporary base plate is removed by using the secondary wet type etching way, thereby avoiding damaging the structure of the semiconductor layer by using a the laser lift off (LLO) method. In addition, by utilizing the secondary wet type etching method, the manufacture process step is simpler, and the technical cost is decreased. On a vertical semiconductor element, the light emitting benefit of the element is increased due to the irregular surface formed by a manufacture process. In addition, by utilizing the wet type etching in the manufacture process, the batch amplification can be increased, and the cost of the manufacture process is decreased.

Description

technical field [0001] The present invention relates to a structure of a III-nitride semiconductor light-emitting element and a manufacturing method thereof, in particular to a method for separating a substrate and a semiconductor layer to form a III-nitride vertical light-emitting element. Background technique [0002] In recent years, LED research and development has mainly focused on improving GaN-based high-luminance LEDs (High-Power Light Emitting Diode). Therefore, GaN LEDs are rapidly extended to applications in extremely high-brightness fields, such as backlight units of various screens, to gradually replace traditional cold-cathode tubes or light bulbs. [0003] There are many ways to improve LED luminescence, such as using omnidirectional reflective cups, roughening the luminous surface, flip-chip technology, etc. The luminous efficiency will be reduced by 5% for every 10 degree increase in the temperature of the element. Since the sapphire substrate is a materia...

Claims

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Application Information

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IPC IPC(8): H01L21/78H01L21/02H01L21/20H01L21/31H01L21/311H01L33/00
Inventor 涂博闵黄世晟叶颖超林文禹吴芃逸马志邦洪梓健沈佳辉
Owner ZHANJING TECH SHENZHEN
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