In-situ monitoring method for outgasing contamination of nonmetallic materials on optical surface of spacecraft

A non-metallic material, optical surface technology, applied in the aerospace field, can solve the problems of non-metallic material outgassing pollution, the deposition amount cannot be quantified in situ, etc., to reduce the risk of on-orbit use, the test process is stable and reliable, and increase the accuracy. Effect

Active Publication Date: 2010-11-03
NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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Problems solved by technology

[0007] The purpose of the present invention is to solve the problem that the amount of deposition on the optically sensitive surface of non-metallic materials used by my country's existi

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  • In-situ monitoring method for outgasing contamination of nonmetallic materials on optical surface of spacecraft
  • In-situ monitoring method for outgasing contamination of nonmetallic materials on optical surface of spacecraft

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Embodiment Construction

[0034] figure 1 It is a schematic diagram of the equipment structure of the in-situ monitoring method for non-metallic material outgassing pollution on the optical surface of a spacecraft of the present invention; wherein, 1-test unit cabinet, 2-vacuum pumping system, 3-vacuum chamber, 4-optical sample , 5-quartz crystal microbalance detector, 6-spectrophotometer, 7-spectrophotometer window, 8-thermal control sample stage, 9-spectrophotometer monitoring window, 10-quartz crystal microbalance monitoring computer, 11-cabinet . Example

[0035] 1) Put 100g of 1mm×1mm×1mm granular space-grade silicone rubber into the thermal control sample stage 4, adjust the angle of view between the quartz crystal microbalance detector 5 and the thermal control sample stage 4 to be 180°, connect water, electricity and gas equipment, and adjust The quartz crystal microbalance monitors the computer 10 communication, and closes the vacuum chamber 3;

[0036] 2) Adjust the spectrophotometer so th...

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Abstract

The invention relates to an in-situ monitoring method for outgasing contamination of nonmetallic materials on an optical surface of a spacecraft, belonging to the technical field of aviation. In the method, a quartz wafer is adopted to monitor contamination level on the optical sensing surface of the spacecraft in situ, and is arranged in a vacuum chamber; a nonmetallic material is arranged in the visual range of a quartz-crystal microbalance to ensure that the material outgases in the vacuum condition; a spectrophotometer and a vacuum system are adjusted, and the nonmetallic material is heated to lead contaminants to escape; frequency and temperature of the quartz-crystal microbalance are monitored online in situ and stored; and the system is closed. The in-situ monitoring method for the outgasing contamination of the nonmetallic materials on the optical surface of the spacecraft has high sensitivity reaching 1.10*10-9 to 4.42*1-9, and the testing process is stable and reliable, and has good repeatability. The method is suitable for large-scale tests.

Description

technical field [0001] The invention relates to an in-situ monitoring method for outgas pollution of non-metallic materials on the optical surface of a spacecraft, belonging to the technical field of aerospace. Background technique [0002] In recent years, the impact of spacecraft molecular contamination on satellite optical payload systems has received much attention. Due to the long life of the satellite and the high performance of the payload, such as the use of sensors with lower and lower operating temperatures and the use of high-power electronic devices, the degree of control over molecular pollution has increased accordingly. Molecular contamination caused by outgassing of materials in a vacuum environment is one of the main sources of contamination. The performance degradation of satellite sensitive optical surfaces is the main effect caused by outgassing molecular contamination, so molecular contamination on optical surfaces must be monitored and controlled in sit...

Claims

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Application Information

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IPC IPC(8): G01N5/00
Inventor 颜则东王先荣王鷁姚日剑柏树冯杰
Owner NO 510 INST THE FIFTH RES INST OFCHINA AEROSPAE SCI & TECH
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