Method for identifying material by means of dual-energy undersampling and system thereof

An under-sampling, material technology, applied in the field of radiation imaging, can solve the problem of inability to achieve low cost, and achieve the effect of low-dose fast scanning, large market application potential, and cost reduction

Active Publication Date: 2010-12-01
TSINGHUA UNIV +1
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Problems solved by technology

[0006] The purpose of the present invention is to propose a dual-energy under-sampling substance identification method and system to solve the problem of low cost, low dose, and fast speed in the current two types of systems that use dual-energy CT imaging technology to reconstruct the detected object and perform substance identification. detection problem

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  • Method for identifying material by means of dual-energy undersampling and system thereof
  • Method for identifying material by means of dual-energy undersampling and system thereof
  • Method for identifying material by means of dual-energy undersampling and system thereof

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[0020] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the drawings, the same reference numerals are used to designate the same or similar components, although shown in different drawings. For clarity and conciseness, detailed descriptions of known functions and constructions incorporated herein will be omitted since they would otherwise obscure the subject matter of the present invention.

[0021] The system according to the embodiment of the present invention is an improved true dual-energy circular trajectory material identification imaging detection system using a CT image-based dual-energy projection undersampling material identification method. like Figure 3A As shown, the system uses a fan beam circular trajectory scanning consisting of a ray source and a layer of detectors. like Figure 5A and 5B As shown, the shape information of the object is obtained by using the CT image re...

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Abstract

The invention discloses a method for identifying a material by means of dual-energy undersampling and a system thereof. The method comprises the following steps of: obtaining the CT image of a material to be detected with a CT image rebuilding method; obtaining a small quantity of dual-energy undersampling projection; obtaining a photoelectric coefficient integral and a Compton coefficient integral according to the dual-energy projection data table lookup; performing region segmentation to the obtained CT image of the material to be detected with an image processing technology and marking the segmented regions; recomputing the length of the obtained small quantity of dual-energy undersampling projection ray which penetrates through each marked region; building an equations set with a dual-energy preprocessing double effect resolving and rebuilding method to be convenient for computing the Compton coefficient and the photoelectric coefficient so as to further obtain the material atomic number and the electron density in each segmented region; and identifying the type of the material to be detected with the material atomic number.

Description

technical field [0001] The invention relates to the technical field of radiation imaging, in particular to a dual-energy undersampling material identification method and system, which can reduce radiation dose and system cost, and increase scanning speed. Background technique [0002] In recent years, due to the fact that dual-energy CT imaging technology can obtain the best detection accuracy, effectively reconstruct the detected object and carry out material identification, it has very important significance in the fields of safety inspection, non-destructive testing, medical diagnosis and so on. [0003] At present, there are two main implementation methods of dual-energy CT imaging technology: one is a pseudo-dual-energy system that uses a specially designed double-layer detector to achieve dual-energy imaging, such as figure 1 shown. according to figure 1 In the method shown, when scanning, after the ray passes through the object, it first reaches the low-energy detec...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04G01N23/087
CPCA61B6/482A61B6/032A61B6/4035G06T11/008G06T2211/408A61B6/4241G06T11/005A61B6/5205
Inventor 陈志强张丽刘圆圆邢宇翔赵自然
Owner TSINGHUA UNIV
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