Method for identifying material by means of dual-energy undersampling and system thereof
An under-sampling, material technology, applied in the field of radiation imaging, can solve the problem of inability to achieve low cost, and achieve the effect of low-dose fast scanning, large market application potential, and cost reduction
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0020] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the drawings, the same reference numerals are used to designate the same or similar components, although shown in different drawings. For clarity and conciseness, detailed descriptions of known functions and constructions incorporated herein will be omitted since they would otherwise obscure the subject matter of the present invention.
[0021] The system according to the embodiment of the present invention is an improved true dual-energy circular trajectory material identification imaging detection system using a CT image-based dual-energy projection undersampling material identification method. like Figure 3A As shown, the system uses a fan beam circular trajectory scanning consisting of a ray source and a layer of detectors. like Figure 5A and 5B As shown, the shape information of the object is obtained by using the CT image re...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com