Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Improved rubidium atom frequency scale

A rubidium atomic frequency standard, an improved technology, applied in the direction of electrical components, automatic power control, etc., can solve the problems of changing the output frequency of the voltage-controlled crystal oscillator module, unable to lock the output frequency of the voltage-controlled crystal oscillator module, etc., to achieve the output frequency stable effect

Inactive Publication Date: 2011-04-06
JIANGHAN UNIVERSITY
View PDF4 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, since the voltage-controlled crystal oscillator module is easily affected by temperature changes and the electronic circuit is designed according to the performance index of the voltage-controlled crystal oscillator module, when the temperature changes, the output frequency of the voltage-controlled crystal oscillator module will Large-scale changes, resulting in the electronic circuit being unable to lock the output frequency of the voltage-controlled crystal oscillator module on the common line frequency of the rubidium atomic transition

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Improved rubidium atom frequency scale
  • Improved rubidium atom frequency scale
  • Improved rubidium atom frequency scale

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] Embodiments of the present invention will now be described with reference to the drawings, in which like reference numerals represent like elements.

[0024] like Figure 1-2 The improved rubidium atomic frequency standard of this embodiment includes: a voltage-controlled crystal oscillator module 10, a frequency selection amplifier module 11, an isolation amplifier module 12, a microprocessor 13, a digital frequency synthesis module 14, a radio frequency multiplication module 15, and a physical system module 16. The first synchronous phase detection module 17 , the temperature compensation module 18 , the GPS deviation correction module 19 and the GPS antenna 20 . Wherein, the radio frequency doubling module 15 includes a radio frequency doubling unit 151 and a microwave doubling and mixing unit 152 .

[0025] The frequency selection amplification module 11 is used for performing frequency selection and amplification before isolating and amplifying the output frequenc...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an improved rubidium atom frequency scale, which comprises a voltage controlled crystal oscillating module, an isolation amplifying module, a microprocessor, a digital frequency synthesis module, a radio frequency multiplication module, a physical system module, a first synchronous phase discrimination module and a temperature compensating module. The isolation amplifying module is used for isolating and amplifying output frequencies of the voltage controlled crystal oscillating module; the microprocessor is used for generating a frequency synthetic instruction, a key-controlled frequency modulation signal and a synchronous phase discrimination reference signal; the digital frequency synthesis module is used for generating a comprehensive modulation signal according to the frequency synthetic instruction and the key-controlled frequency modulation signal generated by the microprocessor; the radio frequency multiplication module is used for generating a microwave polling signal; the physical system module is used for carrying out frequency discrimination on the microwave polling signal and generating a quantum frequency discrimination signal; the first synchronous phase discrimination module is used for carrying out phase discrimination on the quantum frequency discrimination signal and generating a first voltage control signal and the temperature compensating module is used for measuring surrounding temperature of the voltage controlled crystal oscillating module and generating a second voltage control signal according to the temperature. The invention can compensate the influence on the output frequencies of the voltage controlled crystal oscillating module due to the temperature so as to improve the stability of the output frequency of the rubidium atom frequency scale.

Description

technical field [0001] The invention relates to the field of passive rubidium atomic frequency standards, in particular to an improved rubidium atomic frequency standard. Background technique [0002] The atomic frequency standard is a frequency source with excellent stability and accuracy, and has been widely used in the fields of satellite positioning, navigation and communication, instrumentation, and astronomy. The rubidium atomic frequency standard has become the most widely used atomic frequency standard because of its advantages of small size, light weight, low power consumption, and low cost. [0003] The rubidium atomic frequency standard mainly includes a voltage-controlled crystal oscillator module, a physical system module and an electronic circuit. The physical system module specifically includes a spectral lamp for pumping light, an integrated filter resonant bubble for storing rubidium atoms, a microwave cavity for storing microwave fields, and a C-field coil...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03L7/26
Inventor 雷海东管桦
Owner JIANGHAN UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products