Scanning probe system on high field side of Tokamak device

A tokamak and scanning probe technology, which is applied in the direction of measuring devices, electrostatic field measurement, instruments, etc., to achieve the effects of low pollution, high purity, and accurate and reliable data

Active Publication Date: 2011-06-29
SOUTHWESTERN INST OF PHYSICS
View PDF3 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, there are few measurements and studies on the plasma parameters of the strong-field side edge of the Tokamak device in the world.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Scanning probe system on high field side of Tokamak device
  • Scanning probe system on high field side of Tokamak device
  • Scanning probe system on high field side of Tokamak device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] The content of the present invention will be further described below in conjunction with the accompanying drawings.

[0017] like figure 1 , 2 As shown, the strong-field side scanning probe system of the tokamak device consists of two parts: the bracket, the probe mechanism and the control mechanism.

[0018] The probe mechanism includes shaft collar 1, probe holder 2, probe holder connecting pipe 3, shaft sleeve 4, coil and its coil frame 5, shaft 6, fixing bracket 7, bearing 8, lead wire 9 and Probe socket 10. The connecting pipe 3 of the probe holder is cylindrical, and a radial through hole is opened in the upper middle part of the cylindrical wall. The probe holder 2 is in the shape of an end plug, one end of the probe holder 2 is inserted into one end of the probe holder connection pipe 3, the probe holder 2 is connected to the probe holder connection pipe 3, and the probe socket 10 is inserted into the probe The other end of the fixed frame 2. The probe made...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the technical field of Tokamak device, particularly relates to a scanning probe system on a high field side of a Tokamak device, which solves the measurement problem of plasma parameters at the edge on the high field side of the Tokamak device. A shaft is assembled on a fixed bracket through a bearing and a bearing sleeve; a coil, a coil framework and a probe fixed bracket connecting pipe are assembled on the shaft respectively; the coil and the plane surface of the coil framework are mutually perpendicular to the probe fixed bracket connecting pipe in the axial direction; a probe fixed bracket is arranged on the probe fixed bracket connecting pipe; a probe socket is arranged on the probe fixed bracket; probes are arranged on the probe socket and divided into two groups with one group arranged in a circular direction and another group arranged in an electrode direction; and lead wires connected with the probes are led out through the probe fixed bracket connecting pipe. In the scanning probe system provided by the invention, the probes are made of pyrolysis graphite material, and digital raster displacement is adopted for automatic measuring and controlling the movement displacement; and the temperature, the density, and the distribution of electric potential and the field of the electronics at the edge, which are vital parameters in the study of edge physics, can be simultaneously measured within one discharge of the controlled nuclear fusion study device.

Description

technical field [0001] The invention belongs to the technical field of tokamak devices, in particular to a strong field side scanning probe system of a tokamak device. The circular magnetic field on the strong field side of the tokamak device is (longitudinal field) and the pulse current with trigger current I passing through the coil perpendicular to the circular magnetic field, the force F generated by the rotation of the coil frame around the axis drives the probe assembly to scan the plasma edge area along the circular direction, and measures the strong field side Plasma parameters inside and outside the magnetic interface, flow velocity, particle flux, and poloidal and toroidal modulus symmetry and radial propagation of turbulence to study plasma transport and confinement properties. Background technique [0002] Plasma microturbulence can cause anomalous transport of particles and energy. The properties of the edge plasma play a crucial role in the confinement perfo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R19/00G01R29/12
Inventor 洪文玉严龙文
Owner SOUTHWESTERN INST OF PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap