Scanning probe system on high field side of Tokamak device
A tokamak and scanning probe technology, which is applied in the direction of measuring devices, electrostatic field measurement, instruments, etc., to achieve the effects of low pollution, high purity, and accurate and reliable data
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[0016] The content of the present invention will be further described below in conjunction with the accompanying drawings.
[0017] like figure 1 , 2 As shown, the strong-field side scanning probe system of the tokamak device consists of two parts: the bracket, the probe mechanism and the control mechanism.
[0018] The probe mechanism includes shaft collar 1, probe holder 2, probe holder connecting pipe 3, shaft sleeve 4, coil and its coil frame 5, shaft 6, fixing bracket 7, bearing 8, lead wire 9 and Probe socket 10. The connecting pipe 3 of the probe holder is cylindrical, and a radial through hole is opened in the upper middle part of the cylindrical wall. The probe holder 2 is in the shape of an end plug, one end of the probe holder 2 is inserted into one end of the probe holder connection pipe 3, the probe holder 2 is connected to the probe holder connection pipe 3, and the probe socket 10 is inserted into the probe The other end of the fixed frame 2. The probe made...
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Abstract
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