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Aerial drop or parachuting overload testing device

A technology for testing devices and measuring circuits, which is applied in the directions of measuring devices, tension measurement, and acceleration measurement. It can solve the problems of data loss and inaccurate data, and achieve the effects of fast processing speed, accurate and reliable data, and compact structure.

Inactive Publication Date: 2011-08-17
WUHAN UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide an airdrop or skydiving overload test device to solve the problem of inaccurate data or even data loss in the existing parachute opening and landing overload test systems

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  • Aerial drop or parachuting overload testing device
  • Aerial drop or parachuting overload testing device
  • Aerial drop or parachuting overload testing device

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Embodiment Construction

[0030] The present invention will be further described below in conjunction with embodiments and drawings.

[0031] The airdrop or parachuting overload test device provided by the present invention is a device for measuring and recording the force of objects or people during the airdrop or parachuting. The structure of the device is as follows Figure 4 As shown, it includes a single-chip main control circuit, a three-dimensional acceleration measurement circuit, a power supply circuit, a clock circuit, and a Flash storage circuit. The test device is tied to the airdropped object or the parachutist. During the period before landing, the measured three-dimensional data is transmitted to the single-chip main control circuit for processing through the three-dimensional acceleration measurement circuit, and then stored in the Flash storage circuit. After that, the computer analyzes and processes the three-dimensional data in the storage circuit, and the force during the airdrop or par...

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Abstract

The invention relates to an aerial drop or parachuting overload testing device. The testing device is provided with a functional circuit which includes a single chip main control circuit, a three-dimensional acceleration measuring circuit and a Flash storage circuit; the testing device is bound on an aerial drop article or a parachutist body; within a section of time before landing, three-dimensional data measured by the three-dimensional acceleration measuring circuit is transmitted to the single chip main control circuit to be processed and then stored in the Flash storage circuit; after landing, the three-dimensional data in the storage circuit is analyzed by a computer; and a stressing situation in the aerial drop or parachuting process can be obtained through an acceleration variation curve. The aerial drop or parachuting overload testing device provided by the invention has the advantages of small structure, good resistance to shock, pressure and severe environments and accurate and reliable data, can provide reliable experiment data to scientific aerial drop or parachuting trainings, provides an important reference basis to performance evaluation of the parachute and has a certain instructive effect on material selection and a manufacturing process of the parachute.

Description

Technical field [0001] The invention relates to a testing device, in particular to a device for measuring and recording the impact force received by a heavy object or a human body during airdrop or parachuting. Background technique [0002] Airdrop or parachuting is a high-risk activity, and the impact of overload during parachuting and landing can damage materials or endanger the human body. The impact force during parachute opening and landing is an instantaneous impact force. Therefore, to prevent damage caused by impact overload, the magnitude of the overload value must be known. [0003] In order to obtain relevant data during the parachute opening and landing, some foreign researchers have adopted a large number of measurement methods of simulation tests. There are two main types of systems currently used for parachute opening and landing overload testing in China: one is mechanical measurement, which uses pressure sensors to directly record; the other is electrical measurem...

Claims

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Application Information

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IPC IPC(8): G01P15/097G01L5/10G01L5/00
Inventor 陈永泰覃途远刘钊张家明
Owner WUHAN UNIV OF TECH
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