Ohm contact imitation resistor test apparatus and test method

A resistance test and ohmic contact technology, which is applied in measuring devices, measuring resistance/reactance/impedance, and measuring electrical variables, etc., can solve the problems of inconvenient mass product testing, long testing time, and high testing costs, saving production time, The effect of high production cost and long process time

Inactive Publication Date: 2011-10-05
郑峻
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This process is complicated, the test takes a long time, the test cost is high, and it is not convenient for mass product testing

Method used

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  • Ohm contact imitation resistor test apparatus and test method
  • Ohm contact imitation resistor test apparatus and test method
  • Ohm contact imitation resistor test apparatus and test method

Examples

Experimental program
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Embodiment Construction

[0023] according to figure 1 , figure 2 As shown, a simulated ohmic contact resistance testing device includes: a frame-shaped support 1, a pressure regulating valve and a shut-off valve are arranged on the frame-shaped support 1, and a cylinder 2, a pressure-regulating valve and a shut-off valve are also arranged on the frame-shaped support 1 between the shut-off valve and the cylinder 2 respectively through the air supply pipeline; the bottom of the piston rod 5 of the cylinder 2 is connected with a steel plate 6, and the left and right sides of the bottom of the steel plate 6 are respectively provided with a first rubber pressing block 3 and a second rubber pressing block. Pressing block 4, the lower frame of the frame-shaped bracket 1 is provided with a third rubber pressing block 7 and a fourth rubber pressing block 8 corresponding to the positions of the first rubber pressing block 3 and the second rubber pressing block 4, so that the piston When descending, the first ...

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Abstract

Provided is an ohm contact imitation resistor test apparatus and a test method. The method comprises the following steps: (1) ventilating; (2) putting a product to be tested on the base plate of a frame shape support, wherein the test points aim at the metal electrodes and a positioning clamp can be designed according to different products; (3) opening a cylinder switch and pressing downward pressure plates to make the metal electrodes on the pressure plates to fully contact with the product to be tested; (4) reading the resistance value on the ohmmeter; (5) closing the cylinder switch, raising the pressure plates and removing the product tested. The advantages are: (1) the test apparatus helps minimize technology process and save production time; (2) the manufacture process of the test apparatus is simple and the cost of the test apparatus is low; (3) the test apparatus has good stability and easy operation; (4) the test apparatus has a wide application range.

Description

technical field [0001] The invention relates to the technical field of semiconductor resistance material measurement, in particular to a simulated ohmic contact resistance test device and a test method. Background technique [0002] The traditional resistance measurement method of semiconductor resistance materials is to prepare ohmic contact electrodes by metallization at both ends of the material to be tested, and then test the resistance. This process is complicated, the test takes a long time, the test cost is high, and it is not convenient for the test of batch products. Contents of the invention [0003] The purpose of the present invention is to develop a simulation ohmic contact resistance testing device and testing method for directly, accurately, quickly and stably measuring the resistance value of semiconductor resistance materials without the need of ohmic contact electrodes. [0004] The basic principle of the present invention is to press the metal electrode...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02
Inventor 郑峻
Owner 郑峻
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