Method for detecting lead content in submicron silver powder prepared through PVD method by using ICP

Abstract

The invention discloses a method for detecting a lead content in submicron silver powder prepared through a PVD method by using ICP. The method comprises the following steps: (1) preparing submicron silver powder; respectively adding standard sterling silver or the silver powder sample to nitric acid according to a certain ratio, then carrying out mixing and heating to completely dissolve the silver, wherein 1 g of the standard sterling silver or the silver powder is added to 10-30 mL of the nitric acid; (2) cooling the two resulting solutions and respectively carrying out metered volume; (3) drawing standard curves of different lead spectrum lines in the silver solution, wherein the standard curve is drawn through the following steps that: a lead standard solution with a concentration of 0.00 mug / mL and a lead standard solution with a concentration of 10.00 mug / mL are adopted, the spectrum line intensity of the lead is determined under working conditions set through an inductively coupled plasma spectrometer, the lead concentration is adopted as the abscissa, the spectrum line intensity is adopted as the ordinate; (4) selecting the optimal spectrum line; (5) determining the spectrum line intensity in the silver powder solution, and the corresponding lead content, then calculating the lead content in the silver powder. The method provided by the present invention has the following advantages that: the spectrum line is easy to find; the detection cost is low; the method is applicable for the practical detection in the factory.

Description

technical field [0001] The invention relates to the field of ICP-AES (inductively coupled plasma emission spectrometer) detection methods, in particular to a method for detecting lead content in submicron (particle size diameter 100nm-1.0μm) silver powder manufactured by PVD (Physical Vapor Deposition) method by ICP . Background technique [0002] With the increasing maturity of nanotechnology, in order to fully ensure the use effect of the product, the requirements for the impurity content in nano-scale pure metals are becoming more and more stringent, and the accuracy of detection is getting higher and higher, especially for sub- For micron-sized silver powder, the amount of impurity lead in it is an important factor that directly affects the use effect of the product. However, in order to improve the comprehensive value of products while requiring the accuracy of test results, enterprises require the advantages of high efficiency and low cost in testing. But at present,...

AI Technical Summary

Problems solved by technology

However, at present, when ICP detects the lead content in nickel powder, the internal standard method is mostly used. This detection method has the following disadvantages: it is difficult to find spectral lines, and the detection cost is too high, which is not conducive to the actual production detection of the factory.

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