Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Double-workpiece-platform same-phase rotation exchange method based on parallel connection mechanisms, and device thereof

A technology of double workpiece table and workpiece table, which is applied in the field of double workpiece table rotation and exchange in the same phase, can solve the problems of shortening the balance time, loss of the target of the laser interferometer, and large impact torque, etc. The effect of switching efficiency

Inactive Publication Date: 2012-04-04
HARBIN INST OF TECH
View PDF13 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At the same time, it solves the problems of phase inversion of workpiece table, cable winding of workpiece table and target loss of laser interferometer, etc.
The present invention solves the problems of large impact torque and many beats in the existing linear channel change scheme, adopts a smaller mass balance system, which is beneficial to shorten the balance time, simplifies the system at the same time, reduces costs, reduces the cycle time of channel change and shortens the change of channels time, effectively improving the productivity of the lithography machine

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double-workpiece-platform same-phase rotation exchange method based on parallel connection mechanisms, and device thereof
  • Double-workpiece-platform same-phase rotation exchange method based on parallel connection mechanisms, and device thereof
  • Double-workpiece-platform same-phase rotation exchange method based on parallel connection mechanisms, and device thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] Below in conjunction with accompanying drawing, embodiment of the present invention is described in further detail:

[0023] Based on the parallel mechanism, the double-workpiece stage rotation exchange method in the same phase is composed of three beats. The first beat is: after the first worktable completes the exposure process and the second workbench completes the pretreatment process, respectively from the exposure work The station and the pretreatment station move to the center of the abutment, and the clamping device of the rotary conversion table electromagnetically absorbs the first workpiece table rotary ring sleeve of the first workpiece table and the second workpiece table rotary ring sleeve of the second workpiece table. At the same time, X Loosen the first workpiece table adapter device of the first workpiece table and the second workpiece table adapter device of the second workpiece table respectively to the gripping mechanism on the first linear motor mov...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a double-workpiece-platform same-phase rotation exchange method based on parallel mechanisms, and a device of the method, belonging to a technology of semiconductor manufacturing equipment. The device comprises two workpiece platforms, a rotary transfer platform and the two parallel anti-rotation mechanisms; in the rotating exchange process of the two workpiece platforms,the two workpiece platforms are caught and blocked by the rotary transfer platform which rotates around the center of a base station, so that the exchange between an exposure station and a pretreatment station can be realized; and the rotation of the two workpiece platforms can be controlled by the parallel anti-rotation mechanisms, so that the two workpiece platforms can be ensured to have the same phase in the exchange process. The invention solves the problems that the existing scheme for exchanging the platforms in a linear way is high in impact torque and more in platform exchange beats,the existing scheme for exchanging the platforms in a rotating way is reverse in phases of the two workpiece platforms, cables are wound, a target of a laser interferometer is lost, and the like; a smaller mass balance system is adopted, so that the balance time is better shortened, the system is simplified, the cost is reduced, the platform exchange beats are reduced, the time for exchanging theplatforms can be reduced, and the yield of a photoetching machine is effectively improved.

Description

technical field [0001] The invention belongs to the technical field of semiconductor manufacturing equipment, and mainly relates to a method and device for in-phase rotation and exchange of double workpiece tables based on a parallel mechanism. Background technique [0002] Lithography machine is one of the important ultra-precision equipment in the manufacture of very large scale integrated circuits. The resolution and engraving accuracy of the lithography machine determine the minimum line width of the integrated circuit chip. At the same time, the yield of the lithography machine greatly affects the production cost of the integrated circuit chip. As the key subsystem of the lithography machine, the workpiece table It also determines the resolution, overlay accuracy and productivity of the lithography machine to a large extent. [0003] Productivity is one of the main goals of lithography machine development. Under the condition of satisfying the resolution and overlay a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G03F7/20
Inventor 谭久彬刘永猛崔继文金国良
Owner HARBIN INST OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products