Method for measuring CCD (Charge Coupled Device) chip dark current and double temperature constant

Abstract

The invention discloses a method for measuring the CCD (Charge Coupled Device) chip dark current and double temperature constant. The method is realized by the following steps of: arranging a CCD chip in a dewar flask temperature control room, and configuring a reference temperature such that the CCD chip works at the reference temperature, wherein the temperature control room is sealed and light-proof; controlling the CCD chip to shoot an image through a control circuit, and uploading the information of the image to a computer; calculating an average gray value of the obtained image; drawing a fitting curve by utilizing the average gray value of the image and corresponding integration time to obtain a dark current; and finally calculating the double temperature constant by measuring the dark current at a plurality of different temperatures. The method disclosed by the invention has the advantages of high parameter measurement precision and good stability, and is suitable for precise measurement of the dark current and the double temperature constant of the CCD chip.

Description

[0001] The invention belongs to the field of measurement technology, in particular to the measurement of dark current and double temperature constant of CCD chips, which is used for the development, evaluation and screening of CCD chips. Background technique [0002] In the development and application of CCD chips, due to the limitation of processing and measurement technology, the actual dark current, double temperature constant of CCD chips and the measured values ​​given by the manufacturer have certain differences, and in some key application fields, it is necessary to quantify Understand the actual performance parameters of the CCD chip, so as to make reasonable corrections to the collected data and obtain more accurate data. Therefore, it is necessary to propose a method to effectively measure the dark current and double temperature constant of the CCD chip. Through these two performance parameters, the output data of the CCD is processed to obtain more realistic data. ...

AI Technical Summary

Problems solved by technology

[0003] The traditional system for measuring CCD chip parameters cannot measure the dark current and double temperature constant of the CCD chip because there is no temperature control equipment, so it is impossible to evaluate the correlation between the noise of the CCD chip and the temperature, so that users have no relationship with the temperature in chip screening. Relevant parameters are available for reference, and it is also not conducive to the use of CCD chips by users

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